SPring-8 Beamline
The beamlines are shown below with the names, source types and locations. The lengths of normal beamlines are designed to be less than 80 m from the source point.
The lengths of nine and three beamlines are able to extend to 300 m and 1,000 m, respectively.
The PDF Beamline Map is better to print or to see more detail in an enlarged scale.
Light source types and photon energies are designed according to each beamline's research requirements.
Basic research equipment is installed in the experimental hutch.
SPring-8 Beamlines
| Public | Contract | RIKEN | Acceralator Beam Diagnosis |
Total | |
| Operational | 26 | 17 | 8 | 2 | 53 |
| Under Construction | 0 | 3 | 1 | 0 | 4 |
| Total | 26 | 20 | 9 | 2 | 57 |
Public Beamlines
|
Name of Beamline
|
Beamline No.
|
Light Source Type
|
Photon Energy
|
Method of Research
|
| XAFS | BL01B1 | Bending Magnet | 3.8 - 113 keV | XAFS in a wide energy range (local atomic structures and electronic states in amorphous materials and dilute systems). |
|---|---|---|---|---|
| Single Crystal Structure Analysis | BL02B1 | Bending Magnet | 5 - 115 keV | X-ray diffraction from inorganic crystals (atomic structure of advanced materials and thin films, structural phase transition, chemical reaction). |
| Powder Diffraction | BL02B2 | Bending Magnet | 12 - 35 keV | X-ray diffraction from powder crystals (precise electron density distribution of advanced materials, structural phase transition). |
| High Temperature and High Pressure Research | BL04B1 | Bending Magnet | 20 - 150 keV | Energy dispersive X-ray diffraction under high temperatures and high pressures (high pressure geoscience, local structure of supercritical fluids). |
| High Energy X-ray Diffraction | BL04B2 | Bending Magnet | 37.8 keV, 61.7 keV |
X-ray diffraction (crystal structure under high pressure, local structure of amorphous solids and liquids, structural fluctuation at phase transitions). |
| High Energy Inelastic Scattering | BL08W | Wiggler | 100 - 300 keV | Compton scattering (Fermiology). Magnetic compton scattering (magnetic electronic states), X-ray fluorescence analysis of heavy elements. |
| Nuclear Resonant Scattering | BL09XU | Undulator | 6.2 - 100 keV | Time domain Mossbauer spectroscopy, nuclear resonant inelastic scattering, surface and interface structure analysis. |
| High Pressure Research | BL10XU | Undulator | 18 - 35 keV | X-ray diffraction under extreme conditions (high pressure, high temperature and very low temperature), high sensitivity XAFS. |
| Surface and Interface Structure | BL13XU | Undulator | 7 - 32 keV | Atomic-scale structure analysis of a crystal surface, Analysis of nanostructures grown at a vacuum/solid, liquid/solid, and solid/solid interface. |
| Engineering Science Research II | BL14B2 | Bending Magnet | 3.8 -72 keV | XAFS in wide energy region (3.8 to 72 keV), XAFS of dilute systems and thin films. |
| Engineering Science Research I | BL19B2 | Bending Magnet | 3.8 -72 keV | Engineering science researches (X-ray absorption, diffraction, scattering, and fluorescence analysis.) |
| Medical and Imaging II | BL20XU | Undulator | 7.62 - 113keV | Micro-imaging (scanning microacopy, imaging microscopy, micro-tomography, X-ray holography), Medical application (micro-angiography, refraction-enhanced imaging.) |
| Medical and Imaging I | BL20B2 | Bending Magnet | 5 - 113 keV | Medical research (micro-angiography, micro-tomography and refraction-contrast imaging), New imaging techniques. |
| Soft X-ray Spectroscopy of Solid | BL25SU | Undulator | 0.22 - 2 keV | Photoemission spectroscopy. Photoelectron diffraction and holography. Magnetic circular dichronism (electronic states and magnetic properties of solids, surface structure). |
| Soft X-ray Photochemistry | BL27SU | Undulator | 0.17 - 2.8 keV | Soft X-ray photochemistry (photoionization dynamics of atoms and molecules), Soft X-ray CVD (creation, synthesis and processing of new materials.) |
| White Beam X-ray Diffraction | BL28B2 | Bending Magnet | 5 keV < | White X-ray topography (processes of crystal growth, lattice defects, phase transition). |
| High Resolution Inelastic Scattering | BL35XU | Undulator | 8 - 50 keV | Inelastic X-ray scattering, Nuclear resonant scattering. |
| Trace Element Analysis | BL37XU | Undulator | 5 - 37 keV, 75.5 keV |
X-ray micro-spectrochemical analysis, Ultra trace element analysis, High energy X-ray fluorescece analysis. |
| Structural Biology III | BL38B1 | Bending Magnet | 6.5 - 17.5 keV | R&D for optics, data collection system and its software for macromolecular crystallography. Various application of XAFS. |
| Magnetic Materials | BL39XU | Undulator | 5 - 38 keV | X-ray magnetic scattering, Magnetic circular dichromism, X-ray microspectroscopy, Ultra trace element analysis. |
| High Flux | BL40XU | Undulator | 8 - 17 keV | Time-resolved small-angle scattering and diffraction in biology and materials science, Time correlation spectroscopy (speckle pattern). X-ray fluorescence analysis. |
| Structural Biology II | BL40B2 | Bending Magnet | 6 - 17.5 keV | X-ray structure analysis of macromolecular crystals, X-ray small-angle scattering from non-crystalline biological materials. |
| Structural Biology I | BL41XU | Undulator | 6.5 - 17.5 keV, 19 - 37 keV | X-ray structure analysis of macromolecular crystals (protein crystallography, X-ray structual biology). |
| Infrared Materials Science | BL43IR | Bending Magnet | 12 meV - 2.48 eV | Infrared microspectroscopy. Infrared surface science. Infrared absorption/reflection spectroscopy. Infrared magneto-optics. |
| Engineering Science Research III | BL46XU | Undulator | 12 - 25 keV | Insertion Devices and resonant/non-resonant magnetic scattering structure analysis. |
| HAXPES·μCT | BL47XU | Undulator | 5.2 - 37.7 keV | R&D for novel optics, various imaging techniques and methodology for electron beam emittance measurement. |
Contract and JAERI/RIKEN Beamlines, and Others
| Name of Beamline | Beamline No. | Light Source Type | Photon Energy | Method of Research |
| Advanced Softmaterial | BL03XU | Undulator | 6 - 35 keV | |
|---|---|---|---|---|
| University-of-Tokyo Synchrotron Radiation Outstation | BL07LSU | Undulator | 0.25 - 2 keV | time-resolved spectroscopy, nano-beam photoemission spectroscopy, extremely high-resolution soft X-ray emission spectroscopy, three-dimensional scanning photoelectron microscope |
| Hyogo BM (Hyogo Prefecture) | BL08B2 | Bending Magnet | 4.6 - 70 keV | XAFS, X-ray small-angle scattering, X-ray topography, imaging, powder diffraction and X-ray reflectivity. |
| JAEA Quantum Dynamics | BL11XU | Undulator | 6 - 70 keV | Mössbauer spectroscopy. High pressure experiments. Inelastic X-ray spectroscopy. Surface analysis. |
| NSRRC ID (Taiwan) | BL12XU | Undulator | 4.6 - 25 keV | High resolution X-ray scattering, High-resolution resonant x-ray Raman scattering, High Q-resolution scattering, X-ray physics and optics |
| NSRRC BM (Taiwan) | BL12B2 | Bending Magnet | 5 -90 keV | X-ray absorption spectroscopy, Powder X-ray Diffraction, High resolution X-ray scattering, Protein crystallography |
| JAEA Materials Science | BL14B1 | Bending Magnet | 5-90, 5 - 150 keV | Structural analysis in materials science (high pressure/high temperature experiments, surface/interface structural studies). |
| WEBRAM (National Institute for Materials Science) | BL15XU | Undulator | 10-20 keV 0.5 - 60 keV | X-ray powder diffraction, Synthesis process of thin films assisted with X-ray irradiation, X-ray photoemission microscope, Angular resolution X-ray photoemission |
| SUNBEAM ID (13 companies) | BL16XU | Undulator | 4.5 - 40 keV | X-ray diffraction, X-ray fluorescence analysis and X-ray microbeam analysis for characterization of new industrial materials. |
| SUNBEAM BM (13 companies) | BL16B2 | Bending Magnet | 4.5 - 113 keV | XAFS and X-ray topography for characterization of new industrial materials. |
| JAEA Quantum Structural Science | BL22XU | Undulator | 3 - 70 keV | High-pressure studies by using a multi-anvil press or diamond anvil cells, Resonant X-ray diffraction. |
| JAEA Actinide Science | BL23SU | Undulator | 0.4 - 2 keV | Soft X-ray spectroscopy of radioactive materials, Surface photochemistry. Biological radiation effect. |
| Hyogo ID (Hyogo Prefecture) | BL24XU | Undulator | 5 - 60 keV | Protein crystal structure analysis. Surface/interface analysis of inorganic materials. X-ray microbeam analysis. X-ray imaging. |
| Pharmaceutical Industry (21 companies) | BL32B2 | Bending Magnet | 7 - 17 keV | Protein structure analysis for structure-based drug design. |
| TOYOTA | BL33XU | Undulator | 4.5 - 45 keV | time-resolved XAFS / Analysis and evaluation of materials used in car industry |
| Laser-Electron Photon (Osaka University) | BL33LEP | Inverse Compton Scattering | 1.5 - 2.9 GeV | Photonuclear reactions. Magnetic Spectrometer, scintillator array, hadron spectroscopy with polarized gamma rays. Phi meson detection. |
| Macromolecular Assemblies (Osaka University) | BL44XU | Undulator | 7.6 - 16 keV | X-ray crystal structure analysis of biological macromolecular assemblies. |
| RIKEN Coherent Soft X-ray Spectroscopy | BL17SU | Undulator | 0.3 - 1.8 keV | High resolution soft X-ray absorption spectroscopy, high resolution photoelectron spectroscopy, soft X-ray emission spectroscopy and spectroscopic study on multiply charged ions. |
| RIKEN SR Physics | BL19LXU | 25m-long Undulator | 7.2 - 18 keV, 22 - 51 keV |
X-ray non-linear optics, Coherent X-ray optics, Magnetic scattering, X-ray interferometry. |
| RIKEN Structural Genomics I | BL26B1 | Bending Magnet | 6.5 - 17.5 keV | High-throughput protein crystallography (HTPX). |
| RIKEN Structural Genomics II | BL26B2 | Bending Magnet | 6.5 - 17.5 keV | High-throughput protein crystallography (HTPX). |
| RIKEN Coherent X-ray Optics | BL29XU | Undulator | 4.4 - 37.8 keV | X-ray optics, especially coherent X-ray optics. |
| RIKEN Targeted Proteins | BL32XU | Undulator | 8 - 20 keV | Structural biology, X-ray crystallography, Micro crystallography |
| RIKEN Structural Biology II | BL44B2 | Bending Magnet | 6 - 18 keV | Macromolecular crystallography in white and monochromatic X-ray modes. Time-resolved Laue method. XAFS in diluted biological materials. |
| RIKEN Structural Biology I | BL45XU | Undulator | 13.8 keV, 6.8 - 14 keV | Macromolecular crystallography by trichromatic MAD analysis. Solution scattering and fiber diffraction of biological materials. |
| Accelerator Beam Diagnosis | BL05SS |
-
|
- | Diagnosis for technical development of accelerator. |
| Accelerator Beam Diagnosis | BL38B2 |
-
|
-
|
Diagnosis for technical development of accelerator. |