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X-ray Emission Spectroscopy Beamline
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| Homepage | ||
| Relevant Beamline | to be constructed | |
| Organizer | NANAO, Susumu | |
| Affiliation | Institute of Industrial Science, Univ. of Tokyo | |
| Phone | +81-(0)3-5452--6318 | |
| Facsimile | +81-(0)3-5452-6638 | |
| nanao@iis.u-tokyo.ac.jp | ||
| Sub-organizer | UDAGAWA, Yasuo | |
| Affiliation | RISM, Tohoku Univ. | |
| Phone | +81-(0)22-217-5384 | |
| Facsimile | +81-(0)22-217-5337 | |
| udagawa@tagen.tohoku.ac.jp | ||
| Activity | Energy spectra of the X-ray emitted via the second order photo-excitation process give quite valuable information on a selected element which directly reflects ground states and excited states of electrons. From the information, one can deduce band structures, bonding states, dynamic structure factors of electronic systems, pair distribution, etc. This type of spectroscopy for inelastic scattering x-rays is named X-ray Emission Spectroscopy (XES). Though similar information can be obtained by other more conventional means with the first order excitation process, such as X-ray absorption spectroscopy (XAS) and X-ray photo-emission spectroscopy (XPS), electron energy loss spectroscopy (EELS), XES furnishes information which these means cannot afford sufficiently. XES also has experimental advantages over them that it does not need ultra high vacuum and that a wide variety of materials including solids, liquids and gases are available as a sample. In the energy region of Raman scattering, the double differential cross section of the inelastic X-ray scattering gives the dynamic structure factor of the electron system, which leads to an understanding of electron or atomic correlations in space and time. Thus, XES has noticeable potential as novel means for the investigation of materials. The objective of the sub-group for X-ray Emission Spectroscopy Beam Line is to construct the proposed XES beam line and XES spectrometers and to develop the XES studies as the top of the world. |
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