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Local structure analysis of dilute dopants in ceramics

Inquiry number

SOL-0000001063

Beamline

BL01B1 (XAFS I)

Scientific keywords

A. Sample category inorganic material
B. Sample category (detail) insulator, ceramics, amorphous, glass
C. Technique absorption and its secondary process
D. Technique (detail) XAFS, XANES
E. Particular condition polarization (linear), room temperature
F. Photon energy X-ray (4-40 keV)
G. Target information chemical state, chemical bonding, local structure, function and structure, function, electronic state

Industrial keywords

level 1---Application area electric component, display, cell (battery), Chemical product, industrial material
level 2---Target condenser, LCD, PDP、FED, CD-R、DVD, fuel cell, catalysis, fiber
level 3---Target (detail) phosphor
level 4---Obtainable information local structure, electronic state, valence
level 5---Technique XAFS, NEXAFS

Classification

A80.30 inorganic material, M40.10 XAFS

Body text

In this solution, fluorescence XANES method at Ga K-edge was applied to study local environments of ultra dilute Ga dopants (30 ppm) in MgO ceramics. For dilute samples, the fluorescence XANES method is a powerful technique to study local electronic structure (valence, species of neighbor atoms) of selected elements. XANES analysis using first-principles calculations revealed that Ga atom substitutes on a Mg site and extra charges are compensated by formation of a Mg vacancy as shown in model 3.

 
 

Fig. Ga K-edge XANES spectra of Ga dopants in MgO ceramics and structural model (red square: Ga, gray: Mg, white circle: O, red circle: Mg vacancy)

[ I. Tanaka, T. Mizoguchi, M. Matsui, S. Yoshioka, H. Adachi, T. Yamamoto, T. Okajima, N. Umesaki, W.-Y. Ching, Y. Inoue, M. Mizuno, H. Araki and Y. Shirai, Nature Materials 2, 541-545 (2003), Fig. 2,
©2003 Nature Publishing group ]

 

Source of the figure

Bulletin from SPring-8

Bulletin title

SPring-8 Research Fronties 2003

Page

78

Technique

XAFS spectra of dilute samples are taken by fluorescence XAFS method. This method is performed by measuring fluorescence from excited atoms as a function of x-ray energy around an absorption edge of a selected element. A 19-element Ge detector is used for measurement of 1-1000 ppm samples. Acquisition time per XANES spectrum is 15-30 min in this solution. Multi-scattering calculations and first-principle calculations have been successfully applied to the analysis of XANES spectra recently.

Source of the figure

No figure

Required time for experimental setup

4 hour(s)

Instruments

Instrument Purpose Performance
XAFS Measurement System Measurement of XAFS spectra 3.8-113 keV
19 Ge Detector Measurement of XAFS spectra of dilute sample and thin film concentration: 1-1000 ppm, thickness > 0.1 nm

References

Document name
I. Tanaka et al., Nature Materials, 2, 541(2003)

Related experimental techniques

Questionnaire

This solution is an application of a main instrument of the beamline.

Ease of measurement

Middle

Ease of analysis

With a great skill

How many shifts were needed for taking whole data in the figure?

Less than one shift

Last modified 2022-05-06 15:21