Trace-element analysis of Japanese antique chinawares
Inquiry number
SOL-0000001200
Beamline
BL08W (High Energy Inelastic Scattering)
Scientific keywords
A. Sample category | inorganic material, organic material |
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B. Sample category (detail) | environmental material |
C. Technique | fluorescent X-rays |
D. Technique (detail) | trace-element |
E. Particular condition | room temperature |
F. Photon energy | X-ray (> 40 keV) |
G. Target information | trace element |
Industrial keywords
level 1---Application area | environment |
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level 2---Target | Environmental material |
level 3---Target (detail) | ash |
level 4---Obtainable information | element distribution |
level 5---Technique |
Classification
A60.20 environment, A80.30 inorganic material, A80.32 organic material, A80.40 environmental materials
Body text
X-ray fluorescence (XRF) analyses with 116 keV X-rays as an excitation source is suitable for nondestructive multielemental analyses of heavy elements such as rare-earth elements. It also should be useful for nondestructive analyses of rare-earth and heavy elements in geological, geochemical and archaeological samples as well as industrial materials. This shows a plot of intensities of Ba, Nd and Ce Ka lines. There is significant difference between three kinds of antique ceramics, made in Arita, Himetani, and Kutani. The intensities of Ba, Nd and Ce Ka lines showed significant dependence on the place of potteries.
Plot of intensities of Ba, Nd and Ce Ka lines. There is significant difference between three kinds of potteries, made in Arita, Himetani, and Kutani
Source of the figure
Bulletin from SPring-8
Bulletin title
Spring-8 News, 6 (2001)
Page
Technique
The high-energy X-rays emitted from the wiggler and monochromatized by Si400 bent monochromator is injected to the sample. The fluorescence X-rays are detected by a Ge solid state detector.
Source of the figure
No figure
Required time for experimental setup
4 hour(s)
Instruments
Instrument | Purpose | Performance |
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High energy X-ray fluorescent spectrometer | XRF measurement |
References
Document name |
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Spring-8 News, 6 (2001) |
Related experimental techniques
Questionnaire
With user's own instruments.
Ease of measurement
Easy
Ease of analysis
Easy
How many shifts were needed for taking whole data in the figure?
Four-nine shifts