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  BL39XU is an undulator beamline that is dedicated to hard X-ray spectroscopy and diffractometry requiring control of the X-ray polarization state. The major applications of the beamline are X-ray magnetic circular dichroism (XMCD) spectroscopy and resonant X-ray magnetic scattering in 3d transition metals and compounds, rare-earth elements, and 5d metals. The most important feature of BL39XU is the tunability in X-ray polarization states; horizontal/vertical linear, right/left circular, or arbitrary elliptical polarizations are available using diamond X-ray phase plates. The experimental station is equipped with the XMCD spectrometer. Available sample environments are 11 ~ 330 K or 4 ~ 300 K, and 2 T using the electromagnet with the helium-flowing type cryostat or for Pulse-tube type cryostat. For further high-field and low-temperature environments, the 7 T superconducting magnet system is ready to use. A helicity-modulation technique at 30 ~ 40 Hz for precise XMCD measurements is routinely used. This technique allows extremely high quality XMCD spectra obtained in a short acquisition time. 
  For microscopic studies, additional KB mirror optics are used to focus a circular polarized X-ray beam into a φ2-10 μm spot.  Using this microbeam, scanning XMCD imaging and element-specific magnetization measurement can be performed. A diamond anvil cell (DAC) is available for XMCD experiments at high pressures (ambient pressure ~ 100 GPa).
  From 2011A, the nanobeam X-ray absorption spectrometer is available to users at BL39XU, enabling them to perform analyses using 100-nm-order X-ray beams. The spectrometer has been installed by the SR Nano-Beam Analysis Center for Green/Nano-technologies (participating institution: RIKEN), a satellite of the Research Base Networks to Develop a Low-Carbon Society project initiated with a second supplementary budget for fiscal 2009 as part of the Environmental Energy Technology Innovation Plan, which is stationed as a Stepping Stone for Growth Strategy.

The SR Nano-Beam Analysis Center for Green/Nano-technologies:


  • X-ray magnetic circular dichroism (XMCD) spectroscopy
  • Element-specific magnetometry (ESM)
  • X-ray emission spectroscopy (XES) and its magnetic circular dichroism
  • Resonant X-ray magnetic scattering for multilayers
  • XMCD and XAFS microscopy and local ESM with a 100-300 nm spatial resolution
  • XAFS and XMCD at high pressure (0-100 GPa @ room temperature, 0-20 GPa @ low temperature)
  • X-ray spectroscopy using variable X-ray polarization


  • Scientific field
    X-ray magnetic circular dichroism, Element-specific magnetometry, Magnetic EXAFS, Magnetic diffraction, Magnetic scattering, Polarization XAFS, microbeam, magnetic imaging, high pressure
  • Equipment
    X-ray phase plate, Diffractometer, Electromagnet, Superconducting magnet, Cryostat, Polarization analysis, KB focusing mirrors, diamond anvil high pressure cell (DAC)


  This beamline is equipped with an in-vacuum type undulator and a diamond double-crystal monochromator. The combination of fundamental / third harmonics of undulator radiation with the Si 111 or Si 220 reflection of the monochromator enables an energy range of 5 - 38 keV. The photon flux onto a sample is maximized at every X-ray energy by synchronous tuning between the undulator gap and the monochromator angle. A Rh-coated mirror of horizontal deflection is used to reduce the amount of higher harmonics to less than 10-4. The cutoff energy is adjustable from 8 to 20 keV with an appropriate glancing angle between 2 and 8 mrad. The mirror is mechanically bendable for providing a horizontally focused beam (50 - 100 μm in FWHM).  A Pt-coated mirror is also available.

  • Beamline layout

  A diamond X-ray phase retarder (XPR) is installed between the monochromator and the mirror. It functions as a quarterwaveplate with high efficiency. Crystals of various thicknesses (0.10, 0.34, 0.45, 0.73, 1.4, 2.7 and 4.7 mm) are available; selection of an appropriate crystal allows the use of high rate (> 90%) circular polarization of both helicities at 5 ∼ 16 keV. Vertical linear polarization of a reasonable polarization rate (40 ∼ 90%) is also available with an XPR used under the halfwaveplate condition.

  • X-rays at Sample


      Energy range 5 ∼ 38 keV (Si 111 or Si 220)
      Resolution ΔE/E 2 × 10-4 (Si 111),  1 × 10-4 (Si 220)
      Flux at sample 5.3 × 1013 photons/s (Si 111),  2.4 × 1013 photons/s (Si 220) @ 10 keV
      Beam size at sample (FWHM) 0.6 (V) × 0.6 (H) mm2
      Higher harmonic content < 1 × 10-4
      Linear polarization rate 99.9 %
      Circular polarization rate > 90 %




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Please note that each e-mail address is followed by "@spring8.or.jp."

Motohiro SUZUKI
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-0833
Fax : +81-(0)791-58-0830
e-mail : m-suzuki

SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-0833
Fax : +81-(0)791-58-0830
e-mail : naochan

Masaichiro MIZUMAKI
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-0833
Fax : +81-(0)791-58-0830
e-mail : mizumaki

Last modified 2016-09-02 15:34