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BL13XU OUTLINE

Inquiry number

INS-0000000394

ABSTRACT

  The beamline BL13XU is dedicated to reveal structures of surface layers on solids and thin films at the atomic scale by using X-ray diffraction/scattering. The techniques users usually use are grazing-angle x-ray diffraction, crystal-truncation-rod scattering, reflectivity, microbeam diffraction, and reciprocal-space mapping in vacuum as well as in air. When a user investigates a surface structure by abovementioned x-ray diffraction/scattering, she/he uses an ultrahigh-vacuum chamber mounted on a diffractometer. The chamber is equipped with tools for sample preparation and surface analysis in advance. Target materials are widely spread from hard matter (such as a metal and an inorganic material) to soft matter like an organic semiconductor. Many of users have recently measured diffraction from nanostructures such as atomic wires, nanodots, and ultra-thin films. Local structures of device materials, e.g. strains also have been revealed by using microbeam. Not only a static structure analysis of a solid surface/interface, but also an in-situ observation of a dynamic structural response of a surface such as a metal electrode through the imposition of an external field is encouraged.

AREA OF RESEARCH

  • Atomic-scale structural analysis of a crystal surface, an ultra-thin film and a nanostructure
  • Surface structural analysis
  • Analysis of nanostructures grown at a vacuum/solid, liquid/solid, and solid/solid interface
  • Analysis of local structures using microbeam.

KEYWORDS

  • Scientific field
    Surface, Thin film, Diffraction, Crystallography, Nanostructure, Low-dimensional structure
  • Equipment
    Ultra-high vacuum facility, multi-axis diffractometer, Scintillation detector, image plate

SOURCE AND OPTICS

  The source is the standard SPring-8 in-vacuum undulator with a 32 mm period and its number of 140. The period length gives an optimization of the brilliance at about 8.8 keV. The gap would be opened up to 50 mm and closed down to 9.6 mm. A double-crystal monochromator with the Si 111 reflection is positioned at 50.0 m from the light source. The fundamental energy available can be correspondingly covered from 6 to 18.9 keV. A photon energy ranging from 6 to 50 keV is usually used. Two mirrors are located at 54.3 and 55.7 m respectively from the source. The mirrors have two stripes of a rhodium coating and a platinum coating material. These mirrors are for rejecting higher harmonics of incident photons and the down-stream one is for focusing an X-ray beam too. A typical beam size that user groups use with the mirrors is 100 µm. A few µm and a few hundred nm beam can be available by using a refractive focusing lense and the microdiffraction system, respectively.

Fig.1. Schematic view of the beamline optics

  • X-rays at Sample

    Energy Range 6 ∼ 50 keV (Si 111)
    Energy Resolution ΔE/E-10-4
    Photon Flux Standard: 6×1013 ph/s
    High-flux: 1.2×1014 ph/s
    (for 12.4 keV with the maximum beamsize)
    Micro-diffraction system:107 ∼1010 ph/s
    Beam Size (FWHM) Horizontal :2 μm (refractive lens) ∼ 2.0 mm
    Vertical: 2 μm (refractive lens) ∼ 1.5 mm
    Micro-diffraction system:
    Horizontal: 0.15 μm ∼ 1 μm
    Vertical: 0.11 μm ∼ 0.3 μm

 

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CONTACT INFORMATION

Please note that each e-mail address is followed by "@spring8.or.jp."

Hiroo TAJIRI
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-2750
Fax : +81-(0)791-58-0830
e-mail : tajiri

Yasuhiko IMAI
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-2750
Fax : +81-(0)791-58-0830
e-mail : imai

Kazushi SUMITANI
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-0833
Fax : +81-(0)791-58-0830
e-mail : sumitani

Last modified 2016-09-09 14:07
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