Inquiry number

INS-0000000286

ABSTRACT

  The beamline 20XU is designed for application to various imaging technologies: X-ray microscopy, micro-tomography, medical imaging, refraction-enhanced imaging, etc. The BL20XU is the second medium-length beamline in the SPring-8.

AREA OF RESEARCH

• Micro-imaging: Hard X-ray microbeam/scanning microscopy, imaging microscopy, micro-tomography, phase-contrast microtomography with Bonse-Hart interferometer, X-ray holography, coherent X-ray optics, and other experiments on X-ray optics and developments of optical elements
• Medical application: micro-angiography, refraction-enhanced imaging, radiation therapy, phase-contrast CT using interferometer
• Ultra-small angle scattering

KEYWORDS

• Scientific field
  micro-imaging, coherent optics, medical imaging, ultra-small-angle scattering
• Equipment
  
  • High resolution X-ray imaging detectors (CCD camera coupled with optical lens and phosphor screen (beam monitor type II and type III
    Beam monitor type II: field of view 3-6 mm, pixel size 0.3-0.6 µm
    Beam monitor type III: field of view 0.5-2 mm, pixel size 0.5-2 µm
  • X-ray zooming tube (Hamamatsu Photonics C5333): spatial resolution ~ 0.7 µm
  • X-ray Image intensifier (Be window, 4 inches type) 
  • Direct sensing X-ray pickup-tube camera

SOURCE AND OPTICS

  The light source is hybrid-type "in-vacuum" planar undulator whose periodic length is 26 mm. Maximum K-value is designed to be 2.0 at an undulator magnet gap of 7 mm in order to cover the full energy regions above 7.62 keV. Monochromator is "SPring-8 standard" double crystal monochromator placed at 46 m from the source point. The liquid nitrogen cooling system developed at the BL47XU will be employed. The first crystal of monochromator is combination of Si (111) orientation crystal and Si (511) orientation. These two crystals are interchangeable by using linear-translation stage without venting the monochromator vacuum.
  The second crystal is Si 111-orientation. Therefore, by switching only the first crystal, both (+ -) configuration of Si 111-111 and Si 511-333 configuration can be used. Therefore, the energy region from 7.62 to 113 keV is available by the combination of the two reflections.

• Constant exit double crystal monochromator
• SPring-8 standard, cryogenic cooling
• Lattice plane: Si 111 (7.62 - 37.7 keV), Si 511 (23 - 113 keV)
• Range of Bragg angle: 3 -15 degree

Schematic View of Beamline

• X-rays at Sample
  • X-ray beam cross-section: 0.7 mm (vertical) x 1.4 mm (horizontal) at the experimental hutch I (~ 80 m from source point)
    
  • Flux density at the hutch I is about 10¹³ photons/mm² with Si 111 refrection
    
  • X-ray beam cross-section at the experimental hutch II (245 m from souce point): ~ 2 mm × 4 mm

EXPERIMENTAL STATIONS

  Monochromatic beam is extracted into the Medium-length Beamline Facility that is located at about 200 m from storage ring. Two experimental hutches are located at 80 m from source and at 245 m from the source, respectively. The first experimental hutch is in the experimental hall of the storage ring building, and the second one is constructed in the Medium-length Beamline Facility. The first medium length beamline 20B2 is bending-magnet light source beamline and is now used for medical imaging, microscopy, and X-ray topography. The role of BL20XU is complementary to BL20B2. By using high-flux density X-ray beam from the undulator light source, although the beam cross-section is only a few mm even at the end station that is located at 245 m from the undulator, real time observation of live specimen will become possible. It is also to be noticed that a highly coherent X-ray beam can be provided by utilizing the long source to sample distance of 245 m.

• Detectors : conventional type ionization chambers, NaI scintillation counters, pure Ge detector.
• X-ray imaging detectors : CCD camera coupled with optical lens and phosphor screen (beam monitor type II and type III), X-ray zooming tube, X-ray image intensifier, and direct sensing X-ray pickup-tube camera

Versatile high-precision diffractometer for X-ray microscopy at the experimental hutch I

Multi-purpose high-precision diffractometer for various imaging experiments at the experimental hutch II

PUBLICATION SEARCH

* Sorry, Some parts of results are displayed using Japanese characters.

CONTACT INFORMATION

Please note that each e-mail address is followed by "@spring8.or.jp."

Yoshio SUZUKI
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-0833
Fax : +81-(0)791-58-0830
e-mail : yoshio

Akihisa TAKEUCHI
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-0832
Fax : +81-(0)791-58-0830
e-mail : take