SPring-8 Seminar (第318回)
主題/内容 | Spatiotemporal Imaging of Lattice Strain in Microelectronic Devices at Beamline ID01/ESRF |
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開催期間 | 2025年09月19日 (金) 14時00分から15時00分まで |
開催場所 | 中央管理棟1階_上坪記念講堂 |
主催 | JASRI |
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概要 |
Language:English Speaker:Dr. Cedric Corley-Wiciak Affiliation:European Synchrotron Radiation Facility Title:Spatiotemporal Imaging of Lattice Strain in Microelectronic Devices at Beamline ID01/ESRF Abstract:
1 ESRF - European Synchrotron Radiation Facility, 38043 Grenoble, France Static nanoscale mapping of lattice strain by synchrotron-based diffraction microscopy has been demonstrated with great success on many examples in the last decade [1,2]. Nowadays, the advent of high brightness synchrotron sources has sped up the acquisition of diffraction data from microscopic volumes [3] This improvement enables to advance from recording static images towards stroboscopic movies of strain in devices under operation [4], similar to the transition from stationary photography to moving film in the early 20th century. We demonstrate how this capability has been exploited at beamline ID01/ESRF [5], on several prominent examples from the field of microelectronics, visualizing localized heating in a GeSn/Ge-based µ-disk laser and the piezoelectric strain field during hard switching in a GaN/Si High Electron Mobility Transistor.
[1] C. Corley-Wiciak, et al. Small Methods. 8(12), 2400598, 2024 担当者:JASRI 回折・散乱推進室 隅谷和嗣 |
問い合わせ先 |
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