SPring-8, the large synchrotron radiation facility

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2016B SPring-8 Measurement Services

CONTACT: SPring-8 Users Office; E-mail: sp8jasri@spring8.or.jp

S/N Proposal Number Proposal Title Project Leader Affiliation Country Affiliation Category Research Category Shift Beamline Proprietary(P)/
Non-proprietary(Np)
1 2016B1820 XAFS measurement of complex oxides Kazuo Tatsuta Asahi Kasei Chemicals Corp. Japan Industry Industrial Applications 0.25 BL14B2 P
2 2016B1821 XAFS measurements of heavy element adsorbed on iron particle surface. Masayuki Inaba Kobelco Research Institute, Inc. Japan Industry Industrial Applications 0.5 BL14B2 P
3 2016B1822 XAFS measurement of films Kazuyoshi Izawa KYOCERA Corporation Japan Industry Industrial Applications 0.25 BL14B2 P
4 2016B1823 Investigation on the glass structure of fluoroborate glass with highly efficient photoluminescence Kenji Shinozaki National Institute of Advanced Industrial Science and Technology Japan National and Nonprofit Organization Industrial Applications 0.25 BL14B2 P
5 2016B1824 X-ray scattering measurement of non-crystal materials Takahiro Taneda Sumitomo Electric Industries, Ltd. Japan Industry Industrial Applications 0.25 BL19B2 P
6 2016B1825 X-Ray Diffraction Analysis of Cathode Material for Lithium Ion Battery Jiro Okada Sumitomo Metal Mining Co., Ltd. Japan Industry Industrial Applications 0.25 BL19B2 P
7 2016B1826 Powder XRD measurement Hiromi Seki KYOCERA Corporation Japan Industry Industrial Applications 0.25 BL19B2 P
8 2016B1828 Crystal structure analysis of ionic conductor. Akio Mitsui TOYOTA MOTOR CORPORATION Japan Industry Industrial Applications 0.5 BL19B2 P
9 2016B1829 Valence estimation of cobalt species in composite oxide compound. Masayuki Inaba Kobelco Research Institute, Inc. Japan Industry Industrial Applications 0.25 BL14B2 P
10 2016B1830 Analysis of Trace Crystal Structure in Tablet using Synchrotron Radiation X-ray Diffraction Takuji Nabetani Sawai Pharmaceutical Co., Ltd. Japan Industry Industrial Applications 0.25 BL19B2 P
11 2016B1831 Measurment of diverse crystal type(trace amounts) in the pigment. Masayuki Nakano Dainichiseika Color & Chemicals Mfg. Co., Ltd. Japan Industry Industrial Applications 0.25 BL19B2 P
12 2016B1836 X-ray absorption fine structure by fluorescence yield Takeshi Kobayashi Central Research Institute of Electric Power Industry Japan National and Nonprofit Organization Industrial Applications 1.75 BL14B2 P
13 2016B1898 HAXPES measurement for semiconductor substrates Shingo Ogawa Toray Research Center, Inc. Japan Industry Industrial Applications 0.75 BL46XU P
14 2016B1899 EXAFS measurements of magnetic materials. Masayuki Inaba Kobelco Research Institute, Inc. Japan Industry Industrial Applications 0.5 BL14B2 P
15 2016B1900 XAFS measurements of metal species in anode battery materials. Masayuki Inaba Kobelco Research Institute, Inc. Japan Industry Industrial Applications 0.75 BL14B2 P
16 2016B1905 Nano-structure analysis of polymer and polymer-composite materials Yuki Nakama Zeon Corporation Japan Industry Industrial Applications 0.5 BL19B2 P
17 2016B1908 XAFS mesurement of TiO thin film Satoshi Tanaka TOSHIBA NANOANALYSIS CORPORATION Japan Industry Industrial Applications 0.5 BL14B2 P
18 2016B1910 Small Angle X-ray Scattering Analysis for Materials with Hierarchical Structures Naoki Sakamoto Asahi Kasei Chemicals Corp. Japan Industry Industrial Applications 0.5 BL19B2 P
19 2016B1911 Crystal structure analysis of solid electrolyte Hiroshi Yamaguchi Idemitsu Kosan Co., Ltd. Japan Industry Industrial Applications 0.25 BL19B2 P
20 2016B1912 XAFS analysis on metal oxide compound for LIB cathode active materials Shin Takahashi JFE Techno-Research Corporation Japan Industry Industrial Applications 0.5 BL14B2 P
21 2016B1913 XAFS analysis of Pt and Co in solution (4). Mitsutoshi Yokomizo Kobelco Research Institute, Inc. Japan Industry Industrial Applications 1 BL14B2 P
22 2016B1914 High Temperature X-ray Diffraction Amane Kitahara Kobelco Research Institute, Inc. Japan Industry Industrial Applications 0.5 BL19B2 P
23 2016B1915 High Temperature Powder X-ray Diffraction Amane Kitahara Kobelco Research Institute, Inc. Japan Industry Industrial Applications 0.5 BL19B2 P
24 2016B1916 X-ray absorption fine structure Study of PZT films. Satoshi Horiuchi Foundation for Promotion of Material Science and Technology of Japan Japan National and Nonprofit Organization Industrial Applications 0.5 BL14B2 P
25 2016B1917 XAFS analysis of ytterbium species in glass materials. Masayuki Inaba Kobelco Research Institute, Inc. Japan Industry Industrial Applications 0.25 BL14B2 P
26 2016B1919 XAFS measurements Masahiro Kunisu Toray Research Center, Inc. Japan Industry Industrial Applications 1 BL14B2 P
27 2016B1921 XAFS measurements of heavy element adsorbed on iron particle surface. Masayuki Inaba Kobelco Research Institute, Inc. Japan Industry Industrial Applications 0.5 BL14B2 P
28 2016B1922 XAFS measurements of Bromine and Iodine species in battery materials. Masayuki Inaba Kobelco Research Institute, Inc. Japan Industry Industrial Applications 0.75 BL14B2 P
29 2016B1923 2D-GIXD measurement of organic thin films Yuta Inaba Sony Corporation Japan Industry Industrial Applications 0.5 BL46XU P
30 2016B1924 2D-GIXD measurement of organic thin films Yuta Inaba Sony Corporation Japan Industry Industrial Applications 0.25 BL46XU P
31 2016B1925 Structure Analysis Of Glass (Oxide) by XAFS Hajime Tanida NISSAN ARC, LTD. Japan Industry Industrial Applications 0.25 BL14B2 P
32 2016B1926 Crystallinity estimation of Organic Thin Films Hiroto Itoh KONICA MINOLTA, INC. Japan Industry Industrial Applications 0.25 BL46XU P
33 2016B1927 X-ray powder diffraction measurement Kazunori Fukuda Kobelco Research Institute, Inc. Japan Industry Industrial Applications 0.25 BL19B2 P
34 2016B1928 X-ray diffraction measurement of metals Kazunori Fukuda Kobelco Research Institute, Inc. Japan Industry Industrial Applications 0.25 BL19B2 P
35 2016B1929 low-temperature X-ray diffraction measurement of powders Kazunori Fukuda Kobelco Research Institute, Inc. Japan Industry Industrial Applications 0.5 BL19B2 P
36 2016B1930 Structure analysis of thermoelectric Mg3Sb2 and related compounds Tsutomu Kanno Panasonic Corporation Japan Industry Industrial Applications 0.25 BL19B2 P
37 2016B1931 X-ray scattering measurements for non-crystalline materials. Yoshihiro Saito Sumitomo Electric Industries, Ltd. Japan Industry Industrial Applications 0.25 BL19B2 P
38 2016B1932 SAXS measurement of Ni-based superalloy Daisuke Nagahama Honda R&D Co.,Ltd. Japan Industry Industrial Applications 0.5 BL19B2 P
39 2016B1935 XAFS analysis of Pt and Co in solution (5). Mitsutoshi Yokomizo Kobelco Research Institute, Inc. Japan Industry Industrial Applications 0.5 BL14B2 P
40 2016B1936 Valence evaluation of transition metal in electrode Masahiro Ogawa JFE Techno-Research Corporation Japan Industry Industrial Applications 0.25 BL14B2 P
41 2016B1937 Chemical speciation of cesium and related elements in soil Yuichi Takaku Institute for Environmental Sciences Japan National and Nonprofit Organization Environmental Science 0.75 BL14B2 P
42 2016B1938 XAFS Mesurement of TiOx thin film ver2 Satoshi Tanaka TOSHIBA NANOANALYSIS CORPORATION Japan Industry Industrial Applications 0.75 BL14B2 P
43 2016B1939 Powder XRD measurement Hiromi Seki KYOCERA Corporation Japan Industry Industrial Applications 0.25 BL19B2 P
44 2016B1940 USAXS analysis of fine particle dispersion liquid Masayuki Omoto Seiko Epson Corporation Japan Industry Industrial Applications 0.5 BL19B2 P
45 2016B1941 analysis of the valence state of the Ni and Mn in the oxide materials Takuya Mori Kobelco Research Institute, Inc. Japan Industry Industrial Applications 0.25 BL14B2 P
46 2016B1943 XAFS analysis of ytterbium species in glass materials. Masayuki Inaba Kobelco Research Institute, Inc. Japan Industry Industrial Applications 0.5 BL14B2 P
47 2016B1945 XAFS measurements of heavy element adsorbed on iron particle surface. Masayuki Inaba Kobelco Research Institute, Inc. Japan Industry Industrial Applications 0.25 BL14B2 P
48 2016B1946 Structure determination of additional elements in simulated glass Taku Hashimoto IHI Corporation Japan Industry Industrial Applications 0.5 BL14B2 P