SPring-8 Users Community (SPRUC)

Research Group:

Structural Science of Surface, Interface, Thin-Film and Nano-Materials

Contact:
  Hiroo Tajiri
  1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan
  Telephone: +81-791-58-2750
  tajiri(at) spring8.or.jp

Research Area:

Fundamental Characterization, Applied Materials, Measurements

Beamline:

BL13XU, BL09XU, BL11XU, BL15XU

Overview of Research Group, Goals and Purposes:

Solid surfaces and interfaces, and low-dimensional materials grown on them are our research subjects. In particular, target materials are well-defined metal and semiconductor surfaces/interfaces, oxide and catalyst surfaces/interfaces, thin-films, nano-scale structures and device materials. We make use of SPring-8 to reveal structures of surface layers on these solids and thin films at the atomic scale by using X-ray diffraction and scattering, i.e. grazing-incidence X-ray diffraction, crystal-truncation-rod scattering, reflectivity, microbeam diffraction, and X-ray standing wave

We tackle with enhancement of functionalities of existing techniques, and development of new methodologies to contribute toward structural surface science, via discovering new surface phenomena and revealing structural properties of functional surfaces and interfaces by using them.

We intend to make discussions on advanced researches, i.e. surface reaction dynamics, surface superconductivity/superfluid illuminated by X-ray diffraction and scattering. To pursue these research areas, we would like to consider the best optics and experimental instruments for surface diffraction and scattering, and furnish them at promised beamlines. Actually, we installed a wide-band monochmomator using asymmetric silicon crystals as the high-flux optics at BL13XU.

Forthcoming SPring-8-II, the next light source, would serve us high-definition beams with higher-brilliance, such as full-spatial coherent beam, nano-focused beam, and femto- to picoseconds beams by bunch-slicing and so on. We would like to establish how to use these beams effectively for the next surface diffraction and scattering.


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