BL01B1 19Ge detector
Inquiry number
INS-0000000379
19-element Ge solid-state detector for fluorescence mode XAFS
The 19-element Ge solid-state detector is used for fluorescence mode XAFS for dilute or thin film samples which require the higher energy resolution to measure the isolated fluorescence signal from target materials.
| Detectable size | 100 mm2 × 10 mmt × 19 elements |
| Energy range | 3.8 ∼ 113 keV |
| Sample condition | dilute sample concentration > 10 ppm thin film sample thickness > 0.1 nm |
View of glazing-incidence fluorescence XAFS for thin film sample with 19-element SSD.
In K-edge XAFS spectra of 8 wt% In in 3 nm InxGa1-xN film at room temperature [1].
Rh K-edge XAFS spectra of 80 ppm Rh-colloid/EtOH-H2O at room temperature [2].References
- T. Miyajima, Y. Kudo, K.-Y. Liu, T. Uruga, T. Asatsuma, T. Hino and T. Kobayashi, Phys. Stat. Sol. B 228, 45 (2001).
- M. Harada and T. Yamamoto, SPring-8 User Experimental Report, 6 1 (2001).
Last modified
2022-05-06 15:21