BL01B1 CEY detector
Inquiry number
INS-0000000380
Measurement system in conversion electron yield (CEY) mode
The CEY detector will be mainly used for the thin film samples which has high concentration of core-hole atom. CEY mode has the advantage of detecting signals with high efficiency in comparison with fluorescence mode. Sample stage can be continuously rotated by stepping motor to remove diffraction spikes in XAFS spectrum by setting the diffraction condition off.
| Sample stage size | 50 mm φ. |
| Energy range | 3.8 ∼ 50 keV |
| Sample condition | thin film sample thickness > 0.5 nm and others |
CEY detector mounted on θ-2θ stage.
Sample mounted on sample stage.
Ag K-edge XAFS spectra of 1 nm Ag thin film on Si substrate at room temperature [1].
- Sr K XAFS spectra of (Ba,Sr)TiO3 thin film on sapphire substrate measured by CEY detector with and without sample rotation [2]. Arrows, diffraction spikes from sapphire substrate.
References
- Y. Suzuki, T. Miyanaga, K. Kita, R. Maruko, T. Uruga and I. Watanabe, SPring-8 User Report 7, 6 (2001).
- T. Uruga, H. Tanida and K. Yasukawa, unpublished result.
Last modified
2022-05-06 15:21