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Chemical speciation of trace metals in fly ash

Inquiry number

SOL-0000001081

Beamline

BL01B1 (XAFS I)

Scientific keywords

A. Sample category inorganic material
B. Sample category (detail) metal, alloy, amorphous, glass, environmental material
C. Technique absorption and its secondary process
D. Technique (detail) XAFS, XANES
E. Particular condition polarization (linear), room temperature
F. Photon energy X-ray (4-40 keV)
G. Target information chemical state, local structure, elemental composition, trace element

Industrial keywords

level 1---Application area construction, environment
level 2---Target catalysis, Environmental material
level 3---Target (detail) ash
level 4---Obtainable information valence, chemical state
level 5---Technique XAFS, NEXAFS

Classification

A80.40 environmental materials, M40.10 XAFS

Body text

In this solution, fluorescence XANES method was applied to chemical speciation of trace metals in fly ash. For dilute and chemically complex samples, the fluorescence XANES method is a powerful technique to study local electronic structure (valence, species of neighbor atoms) and chemical composition of selected elements. The figure shows Pb-L3 XANES spectra of fly ash samples (0.6-1.1 wt% Pb). Pattern fitting analysis of the XANES spectra (Fig. 1) using reference samples provided the chemical composition of Pb in fly ash, such as amount of PbCl2 and PbS, and information about factors affecting Pb composition.

Fig. Pb-L3 XANES spectra of fly ash samples (0.6-1.1 wt% Pb) and reference materials.

 

Source of the figure

Original paper/Journal article

Journal title

Physica Scripta, T115, 943(2005)

Figure No.

1

Technique

XAFS spectra of dilute samples are taken by fluorescence XAFS method. This method is performed by measuring fluorescence from excited atoms as a function of x-ray energy around an absorption edge of a selected element. A Lytle detector is used for measurement of samples of more than 1000 ppm. Acquisition time per XANES spectrum is 15 min in this solution.

Source of the figure

Private communication/others

Description

講習会プレゼン資料

Required time for experimental setup

4 hour(s)

Instruments

Instrument Purpose Performance
XAFS Measurement System Measurement of XAFS spectra 3.8-113 keV
Lytle Detector Measurement of XAFS spectra of dilute sample and thin film concentration: 1000 ppm, thickness > 10 nm

References

Document name
M. Takaoka et al., Physica Scripta., T115 (2005) 943.

Related experimental techniques

Questionnaire

This solution is an application of a main instrument of the beamline.
With user's own instruments.

Ease of measurement

Middle

Ease of analysis

Middle

How many shifts were needed for taking whole data in the figure?

Less than one shift

Last modified 2022-05-06 15:21