Quick XAFS (QXAFS)
Inquiry number
SOL-0000001211
Beamline
BL01B1 (XAFS I)
Scientific keywords
| A. Sample category | research on method, instrumentation |
|---|---|
| B. Sample category (detail) | metal, alloy |
| C. Technique | absorption and its secondary process |
| D. Technique (detail) | XAFS, EXAFS, XANES |
| E. Particular condition | polarization (linear), time-resolved (slow), room temperature |
| F. Photon energy | X-ray (4-40 keV) |
| G. Target information | chemical state, local structure, function and structure |
Industrial keywords
| level 1---Application area | Semiconductor, electric component, display, storage device, cell (battery), mechanics, construction, environment, Chemical product, industrial material |
|---|---|
| level 2---Target | compound semiconductor, condenser, LCD, PDP、FED, HD,MO, CD-R、DVD, rechargeable battery, and solar cell, fuel cell, catalysis, fiber, Environmental material, health care（shampoo, cosmetics,dental paste） |
| level 3---Target (detail) | phosphor, magnetic layer, electric rod, ash, protein |
| level 4---Obtainable information | local structure, electronic state, valence, chemical state |
| level 5---Technique | XAFS, NEXAFS |
Classification
A80.20 metal ・material, A80.30 inorganic material, A80.32 organic material, A80.34 catalysis, M40.10 XAFS
Body text
XAFS method is a powerful technique to study local structure (distance, coordination number, species of neighbor atoms) and local electronic structure (valence, species of neighbor atoms) of selected elements both in crystalline states and in non-crystalline states. Quick XAFS (QXAFS) mode is a recently developed technique to measure XAFS spectra in a short time. At present, most of the transmission XAFS measurements in BL01B1 are performed in the QXAFS mode, and high quality data can be taken in 3-15 min (20-50% compared with a conventional step-scanning mode). A time-resolved QXAFS mode is possible with a time resolution of seconds to tenth seconds. Unlike energy dispersive XAFS (DXAFS), QXAFS can be used for the fluorescence and conversion electron yield mode.
Fig. Comparison between Pd K-edge EXAFS oscillations of Pd foil obtained by QXAFS and step scan XAFS.
Source of the figure
Private communication/others
Description
第7回XAFS討論会予稿集
Technique
QXAFS method is performed by scanning monochromator continuously and measuring XAFS data. The minimum time resolution of QXAFS is limited by the maximum scanning speed of the Bragg angle of the monochromator. In actual experiments, however, the time resolution is determined by spectral quality.
Source of the figure
Private communication/others
Description
研究会プレゼン資料
Required time for experimental setup
2 hour(s)
Instruments
| Instrument | Purpose | Performance |
|---|---|---|
| XAFS Measurement System | Measurement of XAFS spectra | 3.8-113 keV |
| Lytle Detector | Measurement of XAFS spectra of dilute sample and thin film | concentration: 1000 ppm, thickness > 10 nm |
| CEY Detector | Measurement of XAFS spectra of dense thin film | thickness > 0.5 nm |
| Ionization Chamber | Measurement of transmission mode XAFS | concentration > 1000 ppm |
References
| Document name |
|---|
| 第7回XAFS討論会予稿集 |
Related experimental techniques
Questionnaire
This solution is an application of a main instrument of the beamline.
Similar experiments account for more than 30% of the beamline's subject.
This solution is application of a new instrument installed in the past two years.
Ease of measurement
Easy
Ease of analysis
Easy
How many shifts were needed for taking whole data in the figure?
Less than one shift