SPring-8, the large synchrotron radiation facility

Inquiry number

SOL-0000000892

Beamline

BL02B1 (Single Crystal Structure Analysis)

Scientific keywords

A. Sample category	inorganic material
B. Sample category (detail)	superconductor, solid-state crystal, crystal
C. Technique	X-ray diffraction, X-ray elastic scattering
D. Technique (detail)	wide angle scattering
E. Particular condition	polarization (linear), low-T (~ liquid He)
F. Photon energy	X-ray (4-40 keV)
G. Target information	structure analysis, crystal structure, structural change, phase transition

Industrial keywords

level 1---Application area	electric component, cell (battery), industrial material
level 2---Target	rechargeable battery, and solar cell
level 3---Target (detail)	electric rod
level 4---Obtainable information	crystal structure
level 5---Technique	diffraction

Classification

A80.30 inorganic material, M10.10 single crystal diffraction

Body text

Single crystal x-ray diffraction is a powerful technique to study the periodic arrangement of atoms in materials. Using this technique, one can measure the crystal structure of specimens. By using synchrotron radiation, it can be detected a slight modulation in crystal structure which is never detected by the conventional x-ray source. The figure shows scan profiles of the (1.76, K, 0.5) superlattice reflections of La1.875Ba0.125SrxCuO₄. These data provides structural information such as periodicity, propagation direction and correlation length of the charge stripe order which suppresses high-T_c superconductivity. Thereby, it is found that there exists the strong correlation between the charge stripe order pattern and the structural symmetry of the crystal.

[ H. Kimura, H. Goka, M. Fujita, Y. Noda, L. Yamada and N. Ikeda, Physical Review B 67, 140503(R) (2003), Fig. 2,
©2003 American Physical Society ]

Source of the figure

Original paper/Journal article

Journal title

Phys. Rev. B 67, 140503(R) (2003)

Figure No.

2

Technique

A single crystal diffraction experiment is a powerful technique to study the structure of materials in an atomic scale.  The technique is applicable to any crystalline material and provides knowledge about atomic scale structural information.

Source of the figure

No figure

Required time for experimental setup

12 hour(s)

Instruments

Instrument	Purpose	Performance
4-circle diffractometer	diffraction intensity measurement	equiped with refrigerator

References

Document name
H. Kimura et. al., Phys. Rev. B 67, 140503 (2003).

Related experimental techniques

Questionnaire

This solution is an application of a main instrument of the beamline.

Ease of measurement

With a great skill

Ease of analysis

Middle

How many shifts were needed for taking whole data in the figure?

Less than one shift