Structure determination of a IPR-violating metallofullerene, Sc2@C66
利用事例本文
Powder diffraction is a powerful technique to study crystal structures. Using this technique, one can measure structural parameters such as lattice parameters, atomic positions, etc of crystalline materials. By using synchrotron radiation one can also obtain charge density level structures closely related with physical properties as well as structural parameters. The figure shows charge density distributions obtained by analyzing diffraction data of a metallofullerene, Sc2@C66. These data reveal the fact that the IPR-violating metallofullerene is to be found.
Fig. Charge densities (left) and the structural model (right) of Sc2@C66.
学術利用キーワード
| A. 試料 | 有機材料 |
|---|---|
| B. 試料詳細 | 半導体, 結晶性固体, 結晶 |
| C. 手法 | Ｘ線回折 |
| D. 手法の詳細 | 粉末結晶構造解析 |
| E. 付加的測定条件 | 室温 |
| F. エネルギー領域 | Ｘ線（4～40 keV) |
| G. 目的・欲しい情報 | 分子構造, 構造解析, 結晶構造, 電荷密度 |
産業利用キーワード
| 階層1 | 半導体 |
|---|---|
| 階層2 | |
| 階層3 | |
| 階層4 | 結晶構造 |
| 階層5 | 回折 |
問い合わせ番号
SOL-0000000955
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