Structure determination of a IPR-violating metallofullerene, Sc2@C66
Body text
Powder diffraction is a powerful technique to study crystal structures. Using this technique, one can measure structural parameters such as lattice parameters, atomic positions, etc of crystalline materials. By using synchrotron radiation one can also obtain charge density level structures closely related with physical properties as well as structural parameters. The figure shows charge density distributions obtained by analyzing diffraction data of a metallofullerene, Sc2@C66. These data reveal the fact that the IPR-violating metallofullerene is to be found.
Fig. Charge densities (left) and the structural model (right) of Sc2@C66.
Scientific keywords
| A. Sample category | organic material |
|---|---|
| B. Sample category (detail) | semiconductor, solid-state crystal, crystal |
| C. Technique | X-ray diffraction |
| D. Technique (detail) | powder diffraction |
| E. Particular condition | room temperature |
| F. Photon energy | X-ray (4-40 keV) |
| G. Target information | molecular structure, structure analysis, crystal structure, charge density |
Industrial keywords
| level 1---Application area | Semiconductor |
|---|---|
| level 2---Target | |
| level 3---Target (detail) | |
| level 4---Obtainable information | crystal structure |
| level 5---Technique | diffraction |
Inquiry number
SOL-0000000955
Last modified
2019-11-22 09:17