X-ray powder diffraction from solid deuterium under pressure
問い合わせ番号
SOL-0000001121
ビームライン
BL10XU（高圧構造物性）
学術利用キーワード
| A. 試料 | 無機材料 |
|---|---|
| B. 試料詳細 | 結晶, 分子 (中性) |
| C. 手法 | Ｘ線回折 |
| D. 手法の詳細 | 粉末結晶構造解析 |
| E. 付加的測定条件 | マイクロビーム(>10μｍ), 高圧（DAC）, 低温（〜液体窒素） |
| F. エネルギー領域 | Ｘ線（4～40 keV) |
| G. 目的・欲しい情報 | 結晶構造, 構造変化 |
産業利用キーワード
| 階層1 | 電池, 工業材料 |
|---|---|
| 階層2 | 燃料電池 |
| 階層3 | |
| 階層4 | 密度, 結晶構造, 結晶弾性率 |
| 階層5 | 回折 |
分類
A80.42 エネルギー・資源, M10.20 粉末結晶回折
利用事例本文
The powder diffraction technique of the BL10XU was applied to hydrogen, that is the most light element . Figure shows the powder diffraction patterns of solid hydrogen (deuterium, D2) were collected at pressure up to 94 GPa and at low-temperature (84K). Reflections from solid deuterium could be recorded as clear diffraction lines on a image-plate detector. The integrated one-dimensional diffraction patterns were well assigned to 100 and 101 lines of hcp structure and the volume compression were observed from these data. Ability of powder diffraction technique also has been proved in this experiment (H. Kawamura et al., Solid State Communication, 119(2001)29).
Figure. The diffraction image under pressure (94GPa) and volume compression of D2.
[ H. Kawamura, Y. Akahama,S. Umemoto, K. Takemura, Y. Ohishi and O. Shimomura, Solid State Comｍunication 119, 29-32 (2001), Fig. 3, 4,
©2001 Elsevier Science Publisher ]
画像ファイルの出典
原著論文/解説記事
誌名
Solid State Comunication, 119(2001)29
図番号
3,4
測定手法
The high pressure research beamline BL10XU is designed to perform the X-ray diffraction structure analysis under high-pressure and low/high temperature, using the high brilliance X-rays from the in-vacuum type undulator. The monochromatic and focused X-rays irradiate the sample enclosed in a DAC system, which can generate the pressure up to 300 GPa. The most of the conventional limitations (extremely small size sample area (<100mm), limited diffraction windows, x-ray absorption by diamond and so on) for the DAC high pressure diffraction experiment was extended and upgraded to the high resolution, high angular resolution and high counting statistics diffraction experiment as well as rapid data measurement.
Figure. The diamond anvil cell (DAC)
画像ファイルの出典
BL評価プレゼン資料
測定準備に必要なおおよその時間
1 シフト
測定装置
| 装置名 | 目的 | 性能 |
|---|---|---|
| DAC diffractometer | high pressure x-ray diffraction | <300GPa x-ray diffraction measurement |
| DAC cryostat | high pressure/low temperature | 100GPa, 10K |
参考文献
関連する手法
powder x-ray diffraction, single crystal x-ray diffraction, neutron diffraction
アンケート
SPring-8だからできた測定。他の施設では不可能もしくは難しい
本ビームラインの主力装置を使っている
同種実験は本ビームラインの課題の30%以上を占めている
測定の難易度
中程度
データ解析の難易度
初心者でもOK
図に示した全てのデータを取るのにかかったシフト数
4～9シフト