Charge density study of Cs2Au2Br6 under pressure
Inquiry number
SOL-0000001214
Beamline
BL10XU (High Pressure Research)
Scientific keywords
| A. Sample category | inorganic material |
|---|---|
| B. Sample category (detail) | superconductor, ferroelectric material, crystal |
| C. Technique | X-ray diffraction |
| D. Technique (detail) | powder diffraction |
| E. Particular condition | high pressure (DAC) |
| F. Photon energy | X-ray (4-40 keV) |
| G. Target information | chemical bonding, charge density |
Industrial keywords
| level 1---Application area | storage device, others |
|---|---|
| level 2---Target | |
| level 3---Target (detail) | |
| level 4---Obtainable information | electronic state, valence |
| level 5---Technique | diffraction |
Classification
M10.20 powder diffraction
Body text
The charge density study of Cs2Au2Br6 under pressure were performed by the powder x-ray diffraction at BL10XU and MEM/Rietveld analysis.It reveals that the structural change of Cs2Au2Br6 by applying pressure occurs basically at electron level, such as valence state change and chemical bonding, which may be called the electronic phase transition(M. Sakata et al., Journal of Physics and Chemistry of Solids, 65(2004)1973).
Figure. The MEM charge densities od Cs2Au2Br6 for (002) section under pressure.
[ M. Sakata, T. Itsubo, E. Nishibori, Y. Moritomo, N. Kojima, Y. Ohishi and M. Takata, Journal of Physics and Chemistry of Solids 65, 1973-1976 (2004), Fig. 6,
©2004 Pergamon Press, Elsevier Science Publishers ]
Source of the figure
Original paper/Journal article
Journal title
Journal of Physics and Chemistry of Solids, 65(2004)1973
Figure No.
6
Technique
The high pressure research beamline BL10XU is designed to perform the X-ray diffraction structure analysis under high-pressure and low/high temperature, using the high brilliance X-rays from the in-vacuum type undulator. The monochromatic and focused X-rays irradiate the sample enclosed in a DAC system, which can generate the pressure up to 300 GPa. The most of the conventional limitations (extremely small size sample area (<100mm), limited diffraction windows, x-ray absorption by diamond and so on) for the DAC high pressure diffraction experiment was extended and upgraded to the high resolution, high angular resolution and high counting statistics diffraction experiment as well as rapid data measurement.
Source of the figure
Presentation material for Beamline Report
Required time for experimental setup
2 hour(s)
Instruments
| Instrument | Purpose | Performance |
|---|---|---|
| DAC diffractometer | powder x-ray diffraction | powder x-ray diffraction under pressure |
References
Related experimental techniques
Powder x-ray diffraction, single crystal x-ray diffraction, neutron diffraction
Questionnaire
The measurement was possible only in SPring-8. Impossible or very difficult in other facilities.
This solution is an application of a main instrument of the beamline.
Ease of measurement
Middle
Ease of analysis
With a great skill
How many shifts were needed for taking whole data in the figure?
Two-three shifts

