Inquiry number

INS-0000001684

This system enables non‑destructive, three‑dimensional imaging of nanocrystals, allowing detailed visualization of their morphology as well as internal defects and strain fields.

• It provides non‑destructive, three‑dimensional access to internal structures—such as strain distributions, defects, voids, and domain configurations—in crystalline grains ranging from tens of nanometers to several micrometers, which are difficult to resolve using electron microscopy.
• The technique is based on coherent X‑ray diffraction imaging utilizing Bragg reflections (Bragg-CDI) in the hard X‑ray regime.
• The instrument supports comprehensive characterization of a wide variety of nanomaterials.
• Sample temperatures can be controlled from room temperature up to 1100 ℃, and additional environmental conditions can be accommodated upon request.


Diffractometer for coherent X-ray diffraction imaging