SPring-8, the large synchrotron radiation facility

Inquiry number

INS-0000000357

Grazing incidence in-plane diffractometer (ATX-GSOR)

  Grazing incidence in-plane diffractometer (Rigaku; ATX-GSOR) (Figure) is positioned at experimental hutch 1. The sample is mounted vertically. Techniques available using the instrument are reflectivity measurements, x-ray diffraction and scattering in grazing incidence. The diffractometer has two degrees of freedom on sample (axes ω, and φ) and two degrees of freedom (axes 2-θ and 2θχ) on an x-ray detector. A sample will be covered with a Kapton hemisphere dome of 200 mm in diameter and usually in a helium atomosphere if needed.  An analyzer crystal (silicon 220), a soller slit with an acceptance angle of 0.43 degrees, and double slit will be mounted on the 2-θ (2θχ) arm in the geometry, if a user like. Smallest angular steps for the axes of the grazing incidence in-plane diffractometer are listed in Table 1. An Na(I) scintillation detector is available.

Figure Grazing incidence in-plane diffractometer (Rigaku ATX-GSOR) in experimental hutch 1

• Table 1. Smallest angular steps for the axes of the grazing incidence in-plane diffractometer (Rigaku ATX-GSOR)

  Axis	Step [moving range (Minimum -- Maximum)]
  ω	0.0001(deg/step) [-10 -- 190(deg)]
  φ	0.01(deg/step) [-170 -- 185(deg)]
  2θ	0.0002(deg/step) [-3 -- 158(deg)]
  2θχ	0.001(deg/step) [-3 -- 150(deg)]