BL15XU(WEBRAM) OUTLINE
問い合わせ番号
INS-0000000354
ABSTRACT
The concept of WEBRAM (Wide Energy Beamline for Research in Advanced Materials), constructed by NIMS (National Institute for Materials Science, Japan), is "wide, bright and simple." Monochromatic photon flux (Δλ / λ ‾0.01%) on samples can be obtained from 2.2 keV to 36 keV at about 1012 photons/sec. It is now possible to carry out the following experiments in material research; the analysis of crystal structure with x-rays greater than 6 keV, and the analysis of the electronic structure with 2-10 keV x-rays.
AREA OF RESEARCH
- Highly precise characterization of advanced material
- High energy excitation X-ray photoelectron spectroscopy
- Highly precise X-ray powder diffraction
KEYWORDS
- Scientific field
Analysis for advanced materials, X-ray photoelectron spectroscopy with high energy excitation, High resolution X-ray powder diffraction - Equipment
X-ray photoelectron emission spectrometer, High-precision powder diffractometer
SOURCE AND OPTICS
Schematic View of Beamline
- X-rays at sample
Beamsize : > 0.8 mm (at the 1st experimental hutch, front-end slit: 0.3 mm × 0.3 mm)
| Energy range | XPS: 2.2∼10 keV XRD: 5∼36 keV |
| Energy resolution | ΔE/E = 10-4 |
| Photon flux | ∼1012 photons/sec |
| Beam size | XPS: 30μm in diameter XRD: 0.8 × 0.8 mm2 |
| Feature of Experimental apparatus | XPS Detection angle in the transmission mode : ±7 deg. Angular resolution: less than 0.3 deg. Energy resolution: less than 250meV XRD Detector: imaging plate Angular resolution : Δd/d∼0.1％ |
EXPERIMENTAL STATIONS
At BL15XU, higher brilliance and lower dispersion X-rays are supplied by the revolver type undulator, and there are two experimental hutches: a vacuum and atmospheric experimental hutch (1st hutch) and an ultra-high-vacuum experimental hutch (2nd hutch).
The high-precision powder X-ray diffractometer (photo 1) is installed in the 1st experimental hutch. The powder diffraction with Debye-Scherrer-type optics is mainly carried out for the sample packed into a capillary at present. High quality of powder diffraction data with sufficient intensity and higher angular resolution can be obtained even with shorter wavelength X-rays because of low dispersion X-rays from the undulator. For efficient diffraction data collection, an imaging plate and one-dimensional X-ray detector system have been used for a detector. The sample temperature can be controlled between 50 and 1000 K with N2 or He gas flow systems. The distributed beamtime for one experiment is 3 shifts on average.
A hard X-ray photoelectron analyzer (photo 2), which can analyze 10 keV photoelectrons, has been installed in the 2nd experimental hutch, in the collaboration with Hiroshima University, JAEA and JASRI. Utilizing a large probing depth of high kinetic energy photoelectrons, the surface contamination effect is drastically reduced. Especially, it is suitable for analysis of samples that have difficulty in surface cleaning.
Moreover, this method is powerful to clarify the electronic structure of functional devices which have nanometer-sized layer structures. The distributed beamtime for one experiment is 6 shifts on average.
The more information is available on web-site; http://www.nims.go.jp/webram/e_index.html .
- Photo 1. High-precision powder X-ray diffractometer
- Photo 2. Hard X-ray photoelectron analyzer
PUBLICATION SEARCH
* Sorry, Some parts of results are displayed using Japanese characters.
CONTACT INFORMATION
BL15XU Office, National Institute for Materials Science (NIMS)
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 Japan
Phone : +81-(0)791-58-0223
Fax : +81-(0)791-58-0223
e-mail : 
Web-site : http://www.nims.go.jp/webram/e_index.html