BL16XU OUTLINE

Inquiry number

INS-0000000390

ABSTRACT

This beamline, together with its sister beamline BL16B2, is a contract beamline designed and constructed by an industrial consortium of 13 companies to characterize various materials for industrial purpose. Apparatuses for X-ray diffraction, hard X-ray photoelectron spectroscopy, X-ray microscopy and X-ray fluorescence spectroscopy are installed and utilized for development of various industrial materials.

AREA OF RESEARCH

Characterization of various industrial materials for secondary batteries, fuel cells, catalysts, steels, semiconductors, optical and magnetic devices and others.

KEYWORDS

Scientific field
X-ray diffraction, hard X-ray photoelectron spectroscopy, X-ray fluorescence spectroscopy, X-ray reflectivity, micro analysis and scanning X-ray microscopy, X-ray magnetic circular dichroism (XMCD) spectroscopy and magnetic hysteresis measurement
Equipment
X-ray diffractometer, two-dimensional detector, hard X-ray photoelectron spectrometer, X-ray fluorescence spectrometer, Fresnel zone plate, focusing mirrors in a Kirkpatrick-Baez geometry, diamond phase plate, reactive gas equipment for in-situ measurement (shared with BL16B2), glovebox (shared with BL16B2)

SOURCE AND OPTICS

X-rays at sample

Energy range	4.5 ∼ 40 keV
Energy resolution	ΔE/E ∼ 10^-4
Photon flux	normal ∼ 10¹² photons/s focusing ∼ 10¹⁰ photons/s
Beam Size	normal < 1(H) × 1(V) focusing < 1 μm(H)×1 μm(V)

Schematic View of Beamline

Photograph of beamline BL16XU and BL16B2

EXPERIMENTAL STATIONS

Apparatuses for X-ray diffraction, hard X-ray photoelectron spectroscopy, X-ray microscopy are installed in tandem. A space is prepared at the most downstream side for user’s bringing-in device. The X-ray fluorescence spectrometer is carried into the hutch when used.

Hard X-ray photoelectron spectrometer　(Fig. 1)
- Total energy resolution is less than 250 meV with excitation energy of 6 keV, 8 keV and 10 keV.
- Charge neutralizer by co-irradiation of low-energy electrons and Ar+ ions is equipped.
- Air-sensitive samples can be introduced into the spectrometer without atmospheric exposure by using dedicated sample transfer vessel.
  
  Fig. 1 Hard X-ray photoelectron spectrometer
X-ray diffractometer (Fig. 2)
- An 8-axis diffractometer is installed and used for X-ray diffraction, X-ray reflectivity, grazing incidence X-ray scattering and others.
- Various types of detectors such as NaI (Tl), YAP (Ce) scintillation counter, one-dimensional detector (Mythen) and two-dimensional detector (PILATUS 100K and PILATUS 300K) are available.
  $Fig. 2 X-ray diffractometer$
  
  Fig. 2 X-ray diffractometer
Microbeam experiment system (Fig.3)
- Two microbeam formation systems (Kirkpatric-Baez mirror and Fresnel zone plate) are available.
- Beam size of 0.20 µm×0.23 µm is achieved using Kirkpatric-Baez mirror.
- Microscopic measurements of X-ray diffraction, X-ray fluorescence, XAFS and X-ray magnetic circular dichroism are possible by using microbeam experiment system.
  
  Fig.3 Microbeam experiment system
X-ray fluorescence spectrometer (Fig. 4)
- Sample chamber evacuated to 10 Pa or filled with He-gas at normal pressure.
- X-ray fluorescence spectroscopy and XAFS are available by wavelength-dispersive and energy-dispersive methods.
  
  Fig. 4 X-ray fluorescence spectrometer