Valence of Ba8Mn2Ge44
Inquiry number
SOL-0000000952
Beamline
BL19B2 (X-ray Diffraction and Scattering II)
Scientific keywords
| A. Sample category | inorganic material |
|---|---|
| B. Sample category (detail) | metal, alloy, semiconductor, magnetic material, ferroelectric material |
| C. Technique | absorption and its secondary process |
| D. Technique (detail) | XAFS, XANES |
| E. Particular condition | room temperature |
| F. Photon energy | X-ray (4-40 keV) |
| G. Target information | chemical state |
Industrial keywords
| level 1---Application area | industrial material, others |
|---|---|
| level 2---Target | |
| level 3---Target (detail) | |
| level 4---Obtainable information | electronic state, valence, chemical state |
| level 5---Technique | XAFS |
Classification
A80.30 inorganic material, A80.42 energy, resource, M40.10 XAFS
Body text
In this solution, Mn K-edge XAFS technique was applied to Ge-based clathrates Ba8Mn2Ge44 to analyze valence of doped Mn. XANES spectra reveal valence of the target atom. These data reveal the fact that valence of Mn in the clathrate is very close to that in MnSi.
Mn-K edge XANES spectra of metal Mn, MnO, Mn2O3, MnSi and Ba2Mn2Ge44
Source of the figure
Private communication/others
Description
広沢作成
Technique
XANES is a unique technique to study electronic state and local structure. The technique is applicable to crystal, amorphous, liquid contained a very small quantity of elements and provides knowledge about the valence and local structure of the element.
Source of the figure
No figure
Required time for experimental setup
4-6 hour(s)
Instruments
| Instrument | Purpose | Performance |
|---|---|---|
| XAFS | XAFS spectrum mesurement | 3.8-72KeV |
References
| Document name |
|---|
| X線吸収分光法－XAFSとその応用－太田俊明編 |
Related experimental techniques
Questionnaire
This solution is an application of a main instrument of the beamline.
Ease of measurement
Easy
Ease of analysis
Middle
How many shifts were needed for taking whole data in the figure?
Two-three shifts