放射線触媒の反応機構解析に関する研究
Inquiry number
SOL-0000001476
Beamline
BL22XU (JAEA Actinide Science I)
Scientific keywords
| A. Sample category | inorganic material |
|---|---|
| B. Sample category (detail) | semiconductor |
| C. Technique | absorption and its secondary process |
| D. Technique (detail) | |
| E. Particular condition | room temperature, electric field |
| F. Photon energy | X-ray (4-40 keV) |
| G. Target information | function, electronic state, photochemical reaction |
Industrial keywords
| level 1---Application area | environment, Chemical product |
|---|---|
| level 2---Target | catalysis |
| level 3---Target (detail) | |
| level 4---Obtainable information | chemical state |
| level 5---Technique | XAFS |
Classification
A40.40 surface・interface chemistry, A60.20 environment, A80.12 semiconductor, A80.34 catalysis, A80.36 electrochemistry, M40.10 XAFS
Body text
光触媒にX線を照射したときの効果について調べた例です。図に示すのは、TiO2にTi-K吸収端近傍のX線を照射したときの光電流値をX線エネルギーに対してプロットしたものです。この結果から、TiO2にX線を照射しても、紫外線を照射したときと同じ光触媒反応が起きることがわかりました。
Figure X-ray energy dependencies of photocurrent (triangles),
rest potential (circles), fluorescence intensity (squares)
Source of the figure
Private communication/others
Description
筆者(原研、田村さん）のデーター
Technique
X線照射エネルギーを変化させながら照射し、そのときの光電流や光電位を測定した。
Source of the figure
No figure
Required time for experimental setup
3 hour(s)
Instruments
| Instrument | Purpose | Performance |
|---|---|---|
| ポテンショスタット | 電極電位の制御 |
References
| Document name |
|---|
| 原研 関西研究所年報2003, 90 |
Related experimental techniques
Questionnaire
The measurement was possible only in SPring-8. Impossible or very difficult in other facilities.
Ease of measurement
Middle
Ease of analysis
Middle
How many shifts were needed for taking whole data in the figure?
Two-three shifts