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Study on redox process of Pt catalyst for fuel cell

Inquiry number

SOL-0000000889

Beamline

BL28B2 (White Beam X-ray Diffraction)

Scientific keywords

A. Sample category inorganic material
B. Sample category (detail) metal, alloy
C. Technique absorption and its secondary process
D. Technique (detail) XAFS, EXAFS, XANES
E. Particular condition time-resolved (slow), time-resolved (ms)
F. Photon energy X-ray (4-40 keV)
G. Target information chemical state, local structure, electronic state

Industrial keywords

level 1---Application area cell (battery)
level 2---Target fuel cell, catalysis
level 3---Target (detail) electric rod
level 4---Obtainable information local structure, electronic state
level 5---Technique XAFS

Classification

A80.34 catalysis, A80.42 energy, resource, M40.10 XAFS

Body text

In this solution, Time-resolved XAFS measurement was applied to Pt catalyst for fuel cell during reduction and oxidation process to analyze local structural changes of Pt with a time resolution of 900 miliseconds. DXAFS is a powerful tool for studying dynamic structural changes of materials during chemical reactions. Using this technique, it becomes possible to obtain XAFS spectrum with time resolution of less than 1 second.These data reveal the fact that the surface of the Pt particle is reconstructed in the oxidation process and Pt oxide is removed in the reduction process.

Figure. Time dependence of k3-wighted Fourier Transforms for Pt L3EXAFS in an oxidation process.

Source of the figure

Original paper/Journal article

Journal title

電気化学会72回大会予稿集

Figure No.

1

Technique

Energy dispersive XAFS (DXAFS) is a powerful technique to study of dynamic structural changes of materials.  The technique is applicable to materials during chemical or physical reactions and provides knowledge about a reaction intermediate and the generation process of materials.

Source of the figure

No figure

Required time for experimental setup

1 shift(s)

Instruments

Instrument Purpose Performance
Energy-dispersive XAFS Time resoived XAFS measurement energy region:7-40keV, time resolution:tens of milliseconds to seconds

References

Document name
電気化学会第72回大会予稿集

Related experimental techniques

Questionnaire

This solution is an application of a main instrument of the beamline.
With user's own instruments.

Ease of measurement

Middle

Ease of analysis

Middle

How many shifts were needed for taking whole data in the figure?

Less than one shift

Last modified 2006-03-31 11:24