SPring-8, the large synchrotron radiation facility

Inquiry number

SOL-0000000920

Beamline

BL28B2 (White Beam X-ray Diffraction)

Scientific keywords

A. Sample category	inorganic material
B. Sample category (detail)	semiconductor, ferroelectric material, crystal
C. Technique	X-ray diffraction
D. Technique (detail)
E. Particular condition	2D imaging, low-T (~ liquid He)
F. Photon energy	X-ray (> 40 keV)
G. Target information	structural change, phase transition

Industrial keywords

level 1---Application area	Semiconductor
level 2---Target	silicon semiconductor, condenser
level 3---Target (detail)	capacitance insulator
level 4---Obtainable information	crystal structure
level 5---Technique	imaging

Classification

A80.12 semiconductor, A80.30 inorganic material, M10.10 single crystal diffraction

Body text

White X-ray topography is a powerful technique to study the zone boundary phase transition. Using this technique, one can measure spontaneous strain of strontium titanate in a short measuring time. Figures show white X-ray topographs of domain structure in strontium titanate. These data reveal the temperature dependence of spontaneous strain.

Fig. White X-ray topographs of domains and temperature dependence of spontaneous strain in the (100) plate of strontium titanate.

[ T. Ozaki, K. Kusunose, H. Sakaue, K. Kajiwara, H. Okamoto, Y. Chikaura and T. Suzuki, Nuclear Instruments and Methods in Physics Research B 238, 255-258 (2005), Fig. 2,
©2005 Elsevier Science Publisher ]

Source of the figure

Original paper/Journal article

Journal title

T. Ozaki, K. Kusunose, H. Sakaue, H. Okamoto, K. Kajiwara, Y. Suzuki and Y. Chikaura, Nuclear Instruments and Methods in Physics Research B 238 (2005) 255–258

Figure No.

2

Technique

Fig.1 White X-ray topographic imaging of domain structure in strontium titanate. The hill and valley structure of the (1-10) plane splits the diffraction vector g into g_A for the domain A and g_B for the domain B. The overlap of the images of A and B forms the bright stripes, while the separation of the images of A and B forms the dark stripes, on the image taken with CCD camera. The stripes are parallel to the domain walls as well as g. The splitting between the bright and dark stripes S is related to the camera distance D according to the formula, S=2Dtan[sin^-1(sin2φsinθ_B)]≈4Dφsinθ_B.

[ T. Ozaki, K. Kusunose, H. Sakaue, K. Kajiwara, H. Okamoto, Y. Chikaura and T. Suzuki, Nuclear Instruments and Methods in Physics Research B 238, 255-258 (2005), Fig. 1,
©2005 Elsevier Science Publisher ]

Source of the figure

Original paper/Journal article

Journal title

T. Ozaki, K. Kusunose, H. Sakaue, H. Okamoto, K. Kajiwara, Y. Suzuki and Y. Chikaura, Nuclear Instruments and Methods in Physics Research B 238 (2005) 255–258

Figure No.

1

Required time for experimental setup

24 hour(s)

Instruments

Instrument	Purpose	Performance
X-ray imaging camera	Imaging detecter

References

Document name
T. Ozaki, I. Fijimoto, K. Mizuno, S. Iida, K. Kajiwara, T. Taira, J. Yoshimura, T. Shimura, Y. Chikaura, Nucl. Instr. Meth. Phys. Res. B 199 (2003) 81-84

Related experimental techniques

Questionnaire

The measurement was possible only in SPring-8. Impossible or very difficult in other facilities.

Ease of measurement

Middle

Ease of analysis

Middle

How many shifts were needed for taking whole data in the figure?

Two-three shifts