Off-axis holography
Inquiry number
SOL-0000001103
Beamline
BL29XU (RIKEN Coherent X-ray Optics)
Scientific keywords
| A. Sample category | research on method, instrumentation |
|---|---|
| B. Sample category (detail) | |
| C. Technique | X-ray diffraction |
| D. Technique (detail) | phase measurement |
| E. Particular condition | 2D imaging |
| F. Photon energy | X-ray (4-40 keV) |
| G. Target information | morphology |
Industrial keywords
| level 1---Application area | |
|---|---|
| level 2---Target | |
| level 3---Target (detail) | |
| level 4---Obtainable information | molphology |
| level 5---Technique | diffraction, imaging |
Classification
M60.20 X-ray CT
Body text
A wave front dividing interferometer with a prism was applied to two-beam off-axis holography. The x-ray phase shift due to the amorphous carbon particles was quantitatively determined with the background of the phase image being as small as approximately 1/100 of wavelength (standard deviation) using 12.4 keV X-ray.
The following figures show the experimental setup, the interference pattern observed for the amorphous carbon particles and the complex amplitude distribution at the exit surface of the specimen. Bottom left and bottom right figures show the transmissivity and the phase shift distribution of the specimen.
[ Y. Kohmura, T. Sakurai, T. Ishikawa and Y. Suzuki, Journal of Applied Physics 96, 1781-1784 (2004), Fig. 1, 3, 4,
©2004 American Institute of Physics ]
Source of the figure
Original paper/Journal article
Journal title
Journal of Applied Physics, 96, 4, 1781 (2004)
Figure No.
1,3,4
Technique
Complex amplitude at the detector plane, which were derived from the hologram using the fringe scanning method, were inversely transformed to those at the exit surface of the specimen. By the complete separation of the reference wave and the object wave, retrieved image does not suffer the twin image problem.
Source of the figure
No figure
Required time for experimental setup
12 hour(s)
Instruments
| Instrument | Purpose | Performance |
|---|---|---|
| Kouzu Diffractometer | Aligning sample | |
| Hamamatsu Photonics zooming tube Zooming tube | high resolution detector |
References
| Document name |
|---|
| Y.Kohmura et al., Journal of Applied Physics, 96, 4, 1781 (2004) |
Related experimental techniques
Questionnaire
The measurement was possible only in SPring-8. Impossible or very difficult in other facilities.
This solution is an application of a main instrument of the beamline.
Ease of measurement
Easy
Ease of analysis
With a great skill
How many shifts were needed for taking whole data in the figure?
Two-three shifts