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X線回折顕微法

Inquiry number

SOL-0000001535

Beamline

BL29XU (RIKEN Coherent X-ray Optics)

Scientific keywords

A. Sample category inorganic material, organic material, biology, medicine
B. Sample category (detail) metal, alloy, semiconductor, insulator, ceramics, solid-state crystal, amorphous, glass, organism, cell, biological material
C. Technique X-ray diffraction
D. Technique (detail) coherent scattering, phase measurement, speckle
E. Particular condition 2D imaging, 3D imaging (cf. CT), X-ray microscopy
F. Photon energy X-ray (4-40 keV)
G. Target information structure analysis

Industrial keywords

level 1---Application area Pharmaceuticals
level 2---Target drug design, food, Environmental material
level 3---Target (detail) organism
level 4---Obtainable information
level 5---Technique diffraction, imaging

Classification

A80.12 semiconductor, A80.30 inorganic material, A80.32 organic material, A80.90 others

Body text

X線回折顕微法はオーバーサンプリングしたX線回折強度パターンから試料像を再生することのできるユニークな手法です。この手法を用いることで、 試料の結晶化を要さず、電子密度分布を測定することができます。
図に示すのは、大腸菌試料からの回折強度パターンと二次元再生像です。

図 大腸菌からのX線回折強度パターン

図 X線回折強度パターンから再生した大腸菌の像

[ J. Miao, K. O. Hodgson, T. Ishikawa, C. A. Larabell, M. A. LeGros and Y. Nishino, Proceedings of National Academy of Science of the USA 100, 110-112 (2003), Fig. 1A, 2,
©2003 National Academy of Science ]

 

Source of the figure

Original paper/Journal article

Journal title

J. Miao, K.O. Hodgson, T. Ishikawa, C.A. Larabell, M.A. LeGros, and Y. Nishino, Proc. Natl. Acad. Sci. USA 100, 110 (2003)

Figure No.

1A,2

Technique

コヒーレントX線を試料に照射し、Fraunhofer回折強度を二次元X線検出器で測定します。

Source of the figure

No figure

Required time for experimental setup

24 hour(s)

Instruments

Instrument Purpose Performance
X線回折顕微鏡

References

Document name
J. Miao, Y. Nishino, Y. Kohmura, B. Johnson, C. Song, S.H. Risbud, and T. Ishikawa, Phys. Rev. Lett. 95, 085503 (2005)
Y. Nishino, J. Miao, and T. Ishikawa, Phys. Rev. B 68, 220101(R) (2003)
J. Miao, J.E. Amonette, Y. Nishino, T.I shikawa, and K.O. Hodgson, Phys. Rev. B 68, 012201 (2003)
J. Miao, T.Ishikawa, E.H. Anderson, and K.O. Hodgson, Phys. Rev. B 67, 174104 (2003)
J. Miao, K.O. Hodgson, T. Ishikawa, C.A. Larabell, M.A. LeGros, and Y. Nishino, Proc. Natl. Acad. Sci. USA 100, 110 (2003)
J. Miao, T. Ishikawa, B. Johnson, E.H. Anderson, B. Lai, and K.O. Hodgson, Phys. Rev. Lett. 89, 088303 (2002)

Related experimental techniques

Questionnaire

With user's own instruments.

Ease of measurement

With a great skill

Ease of analysis

With a great skill

How many shifts were needed for taking whole data in the figure?

Two-three shifts

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