X-ray magnetic circular dichroism under extreme condition by using superconducting magnet
問い合わせ番号
SOL-0000001032
ビームライン
BL39XU（X線吸収・発光分光）
学術利用キーワード
| A. 試料 | 計測法、装置に関する研究 |
|---|---|
| B. 試料詳細 | 金属・合金, 半導体, 超伝導体, 磁性体, 絶縁体・セラミックス, 結晶性固体, 非晶質、ガラス, 膜 |
| C. 手法 | 吸収、及びその二次過程 |
| D. 手法の詳細 | XAFS, EXAFS, XANES, MCD, LD |
| E. 付加的測定条件 | 偏光（円、楕円）, 高圧（DAC）, 極低温（< 4 K）, 磁場（> 2 T） |
| F. エネルギー領域 | Ｘ線（4～40 keV) |
| G. 目的・欲しい情報 | 化学状態, 局所構造, 電子状態、バンド構造, スピン・磁性構造, 相転移 |
産業利用キーワード
| 階層1 | 半導体, 記憶装置 |
|---|---|
| 階層2 | HD、MO |
| 階層3 | 磁性層, 磁気ヘッド, スピンバルブ膜 |
| 階層4 | 局所構造, 電子状態, 磁化, 磁気異方性, 界面磁気構造, 価数, 化学状態 |
| 階層5 | XAFS, XMCD |
分類
A80.12 半導体・電子材料, A80.14 磁性材料, A80.20 金属・構造材料, M40.10 XAFS, M40.30 磁気吸収
利用事例本文
X-ray Magnetic Circular Dichroism (XMCD) is a unique technique to study electronic states for the specific element and its orbital.XMCD measurement under high magnetic field can be performed by using superconducting magnet (SCM) at BL39XU of SPring-8 because a diamond X-ray phase retarder enables to generate left and right circularly polarized X-rays.
Maximum magnetic field of 10 T can be applied by using this SCM, and sample temperature can be controlled in the range of 2-300 K. Studies on metamagnetism transition in which ferromagnetic state is induced by applying high magnetic field or on ferromagnetic states in the extreme low temperature region are actively performed by installing the SCM. In particular, sample environment under high magnetic field at extreme low temperature is effective to study ferromagnetic compounds including lanthanoid or actinoid elements. Recently, a diamond-anvil-cell (DAC) for generating high pressure is mounted in the SCM (see in Fig. 1) so that the XMCD measurement is performed under extreme conditions of high pressure,high magnetic field, and extreme low temperature.
Fig. 1 Diamond-anvil-cell (DAC) which enables to be mounted in the superconducting magnet
(designed by Dr. Ishimatsu of Hiroshima University).
Fig. 2 shows the XMCD spectrum under high pressure at Pt L3-edge in ordered-FePt alloy. This is the result under the field of H = 10 T at the pressure of P = 20 GPa at room temperature. Fig. 3 shows pressure dependent of the ratio Lz/Sz of Pt 5d electrons according to magneto-optical sum rules, where Lz and Sz represent the expectation of orbital and spin magnetic moments, respectively. Thus, XMCD spectrum enables to measure under extreme conditions of high magnetic field,high pressure, and extreme low temperature.
Fig.2 Pt L3-edge XMCD spectrum of ordered-FePt alloy under the field of H = 10 T,
the pressure of P = 20 GPa at room temperature.
Fig. 3 Pressure dependence of Lz/Sz of Pt 5d electrons in ordered-FePt alloy (H = 10 T).
画像ファイルの出典
私信等、その他
詳細
広島大学 石松氏から提供
測定手法
An X-ray magnetic circular dichroism (XMCD) spectrum is measured by monitoring a small difference in X-ray absorption spectra between for right- and left-circular polarizations. In this solution, X-ray energy was tuned to the characteristic absorption edges of Pt to observe magnetism of the Pt 5d electrons.
Fig. Principle of X-ray magnetic circular dichroism (XMCD) measurement.
画像ファイルの出典
私信等、その他
詳細
鈴木基寛氏により作成
測定準備に必要なおおよその時間
6 時間
測定装置
| 装置名 | 目的 | 性能 |
|---|---|---|
| 10 T superconducting magnet | measuremento of X-ray magnetic circular dichroism spectrum and element specified magnetization process under extreme condition | maximum applied magnetic field of 10 T, temperature range of 2-300 K at sample position |
参考文献
| 文献名 |
|---|
| 石松直樹、山田真裕、圓山裕、河村直己、第46回 高圧討論会、室蘭工業大学、2P24、2005年10月. |
| S. Uemoto, H. Maruyama, N. Kawamura, S. Uemura, N. Kitamoto, H. Nakao, S. Hara, M. Suzuki, D. Fruchart, and H. Yamazaki, J. Synchrotron Rad. 8, 449 (2001). |
| J. Chaboy, C. Piquer, N. Plugaru, M. Artigas, H. Maruyama, N. Kawamura, and M. Suzuki, J. Appl. Phys. 93, 475 (2003). |
| J. Chaboy, H. Maruyama, N. Kawamura, and M. Suzuki, Phys. Rev. B 69, 014427 (2004). |
| T. Honma, N. Kawamura, M. Suzuki, M. Mizumaki, H. Maruyama, N. Ishimatsu, Y. Inada, and Y. Onuki, J. Physics: Condensed Matter 15, S2171 (2003). |
| J. Chaboy, M. A. Laguna-Marco, M. C. Sanchez, H. Maruyama, N. Kawamura, and M. Suzuki, Phys. Rev. B 69, 134421 (2004). |
| H. Maruyama, N. Ishimatsu, and N. Kawamura, Physica B 351, 328 (2004). |
| Y. Yamamoto, T. Miura, M. Suzuki, N. Kawamura, H. Miyagawa, T. Nakamura, K. Kobayashi, T. Teranishi, and H. Hori, Phys. Rev. Lett. 93, 116801 (2004). |
関連する手法
アンケート
SPring-8だからできた測定。他の施設では不可能もしくは難しい
本ビームラインの主力装置を使っている
ユーザー持ち込み装置を使った
測定の難易度
中程度
データ解析の難易度
中程度
図に示した全てのデータを取るのにかかったシフト数
2～3シフト