SPring-8, the large synchrotron radiation facility

Inquiry number

SOL-0000001082

Beamline

BL39XU (X-ray Absorption and Emission Spectroscopy)

Scientific keywords

A. Sample category	inorganic material
B. Sample category (detail)	magnetic material, synthetic multilayer
C. Technique	X-ray diffraction
D. Technique (detail)	magnetic scattering
E. Particular condition	polarization (circular), room temperature, magnetic field (< 2 T)
F. Photon energy	X-ray (4-40 keV)
G. Target information	spin/magnetism

Industrial keywords

level 1---Application area	storage device
level 2---Target	HD,MO
level 3---Target (detail)	magnetic layer, magnetic head, spin valve
level 4---Obtainable information	magnetic moment, interface magnetic structure
level 5---Technique	magnetic scattering, magnetic Compton scattering, PEEM

Classification

A80.14 magnetic materials, M25.10 magnetic scattering

Body text

Resonant X-ray magnetic scattering is a unique technique to study the magnetization distribution inside a layered magnetic film. Using this technique, one can measure the magnetization depth profile of each layer of magnetic multilayers consisting of 3d transition metals or rare-earth metals. Sensitivity of the technique is so high that a profile of small magnetization induced in a non-magnetic layer, such as Cu, can be determined. The figure shows magnetic scattering peaks of an exchange-coupled [Co(1.25 nm)/Cu(3.88 nm)]₅₀ multilayer. These data indicate that magnetization of the Co layer is even distribution, while magnetization of the Cu layer is oscillatory damping as the distance from the interface.

Fig. Resonant X-ray magnetic scattering peaks in an exchange-coupled [Co(1.25 nm)/Cu(3.88 nm)]₅₀ multilayer.

[ Y. Hayasaki, K. Ishiji, H. Hashizume, N. Hosoito, K. Omote, M. Kuribayashi, G. Srajer, J. C. Lang and D. Haskel, Journal of Physics :Condensed Matter 16, 1915-1925 (2004), Fig. 10,
©2004 Institute of Physics and IOP Publishing, Ltd. ]

Source of the figure

Original paper/Journal article

Journal title

Y. Hayasaki et al., J. Phys.: Condens. Matter 16, 1915 (2004).

Figure No.

Fig. 10

Technique

Resonant X-ray magnetic scattering signals are recorded by monitoring a small difference in the diffraction intensities between for right- and left-circularly polarized X-rays.  In this solution, X-ray energy is tuned to the K edge (Co: 7723 eV and Cu: 8992 eV) of each elements to obtain magnetic scattering peaks for Co and Cu.

Source of the figure

No figure

Required time for experimental setup

2 shift(s)

Instruments

Instrument	Purpose	Performance
Two-axes diffractometer	Resonant X-ray magnetic scattering measurements	Angular resolution 0.36 arcsec/step, four-circle goniometer

References

Document name
Y. Hayasaki, K. Ishiji, H. Hashizume, N. Hosoito, K. Omote, M. Kuribayashi, G. Srajer, J. C. Lang, and D. Haskel, J. Phys.: Condens. Matter 16, 1915 (2004).

Related experimental techniques

XMCD, X-ray magnetic circular dichroism, element-specific magnetometry, magnetoresistance measurements, SQUID magnetometry, VSM magnetometry

Questionnaire

The measurement was possible only in SPring-8. Impossible or very difficult in other facilities.
With user's own instruments.

Ease of measurement

Middle

Ease of analysis

With a great skill

How many shifts were needed for taking whole data in the figure?

Four-nine shifts