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BL44B2 OUTLINE

Inquiry number

INS-0000000381

ABSTRACT

 BL44B2 is the Materials Science beamline using total scattering, which is based on measurements of both Bragg and diffuse scattering. Unlike powder diffraction beamlines and PDF beamlines, total scattering beamlines require a fine-Q (the magnitude of scattering vector) step in a wide range of Q. This beamline yields total scattering data with a step of 10-3 Å-1 in a range of 30 Å-1, which definitely have a signal-noise ratio of 105 and over. Thus, the beamline allows crystal- and local-structure analysis of a variety of materials, such as crystalline, amorphous, nano, and porous materials.

[References]
K. Kato et al., J. Synchrotron Rad. 27, 1172-1179 (2020).
https://doi.org/10.1107/S1600577520008929
K. Kato et al., J. Synchrotron Rad. 26, 762-773 (2016).
https://doi.org/10.1107/S1600577519002145

AREA OF RESEARCH

  • Crystal- and local-structure analysis of crystalline materials
  • Local-structure analysis of amorphous and nano materials
  • Hierarchical-structure analysis of porous materials, etc.

KEYWORDS

  • Scientific field
    Total scattering, Powder diffraction
  • Equipment
    Two-axis powder diffractometer equipped with a one-dimensional photon-counting detector system
    Nitrogen-flow low-temperature device (-180~200°C), Nitrogen-flow high-temperature device (RT~800°C)
    In situ gas adsorption system

SOURCE AND OPTICS

Monochromatic X-rays obtained by a Si 111 double-crystal monochromator are decreased in higher harmonics, and vertically and horizontally focused on a sample with a Pt-coated Si mirror.

  • X-rays at sample
    Energy range 15.5 ∼ 30.2 keV
    Energy resolution 104 in EE
    Photon flux
    Beam size
    1011 photons/s
    0.5 mm (V)×3.0 mm (H)
    Layout of the beamline

    Layout of the beamline

EXPERIMENTAL STATIONS

 A two-axis powder diffractometer, which is equipped with a total scattering measurement system 'OHGI' (Overlapped High-Grade Intelligencer), has been installed at the experimental booth. OHGI can cover a 2θ range from 0.5° to 153° with a step of 0.01° by a single measurement. Based on the on-demand correction for X-ray response non-uniformity according to the experimental conditions, OHGI always provides unprecedented total scattering data taking advantage of the dynamic range of the photon-counting architecture.

Total scattering measurement system 'OHGI'

Total scattering measurement system 'OHGI'

[References]
A. A. Pinkerton, Acta Cryst. A 77, 83-84 (2021).
https://doi.org/10.1107/S2053273321000759
B. Svane et al., Acta Cryst. A 77, 85-95 (2021).
https://doi.org/10.1107/S2053273320016605
J. Beyer et al., IUCrJ 8, in press (2021).
https://doi.org/10.1107/S2052252521001664

PUBLICATION SEARCH

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BL44B2 PUBLICATION SEARCH

CONTACT INFORMATION

Please note that each e-mail address is followed by "@spring8.or.jp."

Kenichi KATO
RIKEN SPring-8 Center
1-1-1, Kouto, Sayo-cho, Sayo-gun, Hyogo, 679-5148
Phone : +81- (0)791-58-2942 
e-mail : katok

Last modified 2021-04-13 15:46
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