SPring-8, the large synchrotron radiation facility

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 BL44B2 is the Materials Science beamline using total scattering, which identifies Bragg reflections based on long-range order in atomic configuration with diffuse scattering based on short-range order. Unlike conventional powder diffraction, total scattering requires high-Q resolution data in a wide range of scattering vector Q. The measurement system at the beamline yields total scattering data with a resolution of 10-4 Å in a range of 30 Å, which also has a relative error of 0.1% equivalent to the precision of 106 counts. Thus, the beamline allows crystal and local structural analysis of a variety of materials, such as crystalline, amorphous, nano, and porous materials

K. Kato and H. Tanaka, Adv. Phys.: X 1, 55-80 (2016).

K. Kato et al., AIP Conf. Proc. 1234, 875-878 (2010).


  • Crystal and local structure analysis of crystalline materials
  • Local structure analysis of amorphous and nano materials
  • Hierarchical structure analysis of porous materials, etc.


  • Scientific field
    Total scattering, Powder diffraction
  • Equipment
    Two-axis powder diffractometer equipped with the one-dimensional photon-counting detector system, Nitrogen-flow low-temperature device (-180~200℃), Nitrogen-flow high-temperature device (RT~800℃), In situ gas adsorption system


Monochromatic X-rays obtained by a Si 111 double-crystal monochromator are decreased in higher harmonics, and vertically and horizontally focused on a sample with a Pt-coated Si mirror. The energy is available from 11.5 keV (1.08 Å) to 27.6 keV (0.45 Å). The dimensions of X-rays at the sample positon are 0.5 mm in vertical by 3.0 mm in horizontal.

  • X-rays at sample
    Energy range 11.5 ∼ 27.6 keV
    Energy resolution 10-4 in ΔE/E
    Photon flux
    Beam size
    1011 photons/s
    0.5 mm (V)×3.0 mm (H)
    Layout of the beamline

    Layout of the beamline


 The two-axis powder diffractometer, which is equipped with fifteen one-dimensional photon-counting modules (MYTHEN, DECTRIS Ltd.) in a curve without space between modules, has been installed at the experimental booth. Taking advantage of the overlap between adjacent modules, the granularity of powder samples can be checked without using two-dimensional detectors. Such a gapless arrangement of modules can cover the range from 1° to 153° with a resolution of 0.01° by a single measurement. In addition, higher-resolution (0.005°) data can be obtained by a series of two measurements. The detector system has original correction factors for X-ray response non-uniformity in each microstrip, leading to high-accuracy data according to the Poisson statistics even at the intensity of 106 counts. The sample temperature can be controlled from -180℃ to 800℃ continuously by two nitrogen-flow devices. Also, the in situ gas adsorption system is available for porous materials while rotating a capillary sample.

K. Kato et al., J. Synchrotron Rad. 26 (2019).

Detector system for total scattering

Detector system for total scattering


* Sorry, Some parts of results are displayed using Japanese characters.




Please note that each e-mail address is followed by "@spring8.or.jp."

Kenichi KATO
RIKEN SPring-8 Center
1-1-1, Kouto, Sayo-cho, Sayo-gun, Hyogo, 679-5148
Phone : +81- (0)791-58-2942 
e-mail : katok

Last modified 2019-04-22 10:47