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BL46XU Multi-Axis Diffractometer

Inquiry number

INS-0000001490

Multi-axis X-ray Diffractometer

The multi-axis diffractometer system at BL46XU has been designed to meet diverse needs of industrial users in X-ray diffraction and scattering analysis. It has a wide range of application from structure analysis of thin films, surface and interface to residual strain analysis and in-situ X-ray diffraction.

The diffractometer consists of eight axes: four basic (χ, φ, ω, 2θ) and four additional (2θz, θz, ωa, 2θa ) axes. A C-type χ cradle is adopted to get a wide scattering angle range (-20° to 160°) by avoiding dead angle. Samples can be put on a motorized XYZ or swivel stage not only for fine adjustment of the sample position but for mapping measurement of irradiated positions. We also have a He-gas-exchange sample chamber with a kapton dome (200mm in diameter and 50mm in thickness) to effectively reduce the background noise due to air-scattering around the sample.

In the optics, there are a total of three motorized four-quadrant slits: one is put at the upstream side of the diffractometer for adjustment of beam size and the other two are put on the detector arm for controling collimation of detecting signal. An analyzer stage is installed on the detector arm (ωa, 2θa). The analyzer crystal, Si (111), Ge (111) and LiF (002) are provided. A solar slit can be set on the analyzer stage to improve the detection efficiency of scattering signals from an irradiation area broaden at the sample surface in grazing-incident X-ray scattering measurement. An attenuator autochanger has been installed for X-ray reflectivity spectra measurement of the dynamic range of around ~1010.

NaI scintillation counter is the standard detector at this beamline. In combination with two-dimensional pixel detector (PILATUS) or imaging plate (IP), etc., a variety of experiments including time-resolved X-ray diffraction measurement can be performed.

We use SPEC (Certified Scientific Software) as a control program. SPEC is a command line program where macro functions enables automatic multi-measurements. The macro functions can also be used for rapid sample exchange by controlling automatic adjustment of the sample position.

 

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Multi-axis X-ray Diffractometer

 

Last modified 2010-05-20 10:51