BL47XU Hard X-ray photoemission spectroscopy
Inquiry number
INS-0000001385
Due to the large escape depth of the photoelectrons, Hard X-ray Photoemission Spectroscopy (HAXPES) allows the properties of intrinsic bulk states to be investigated. Conventional PES techniques with low excitation energies are surface-sensitive due to short inelastic mean-free-paths (IMFPs), and it is difficult to obtain information on the bulk electronic structures which are closely correlated with the characteristics of the intrinsic materials. In order to overcome these shortcomings, we have developed an HAXPES analyser for use in the hard x-ray region (6-10 keV), and extended the coverable range of the electron energy analyser to the same 6-10keV region. This enables us to probe bulk electronic states due to IMFPs as 20nm by taking advantage of high photon flux of SPring-8. The system consists of a VG-SCIENTA R4000 spectrometer combined with double crystal monochromator at BL47XU. Angle dependence of PES in hard x-ray region can also be performed using this system, which provides the electronic states from bulk to surface. The figure of chamber image, analyzer specifications, and results of typical estimation using 10KeV photon energy shows as follows.
