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Grain boundary characterization utilizing high-resolution X-ray CT and SEM/EBSP orientation analysis

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Body text

High-resolution X-ray computer tomography is a non-destructive inspection to study micro-defects of inside materials three dimensionally. An elemental mass ratio, i.e. concentration is investigated by the use of a linear absorption coefficient value, which is different from elementals in the X-ray CT. Figures show (a) distribution of gallium concentration obtained by X-ray CT and (b) grain orientation mapping investigated by SEM/EBSP analysis in the same region of a sample surface. High concentrations have been observed on grain boundary with a high misorientation angle that is considered having high energy. Dependence of the concentration on grain boundary character is revealed.

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Scientific keywords

A. Sample category inorganic material
B. Sample category (detail) metal, alloy, solid-state crystal
C. Technique absorption and its secondary process
D. Technique (detail)
E. Particular condition 3D imaging (cf. CT), interface, room temperature, time-resolved (slow)
F. Photon energy X-ray (4-40 keV)
G. Target information local structure, dislocation, strain, structural change, morphology

Industrial keywords

level 1---Application area mechanics, industrial material
level 2---Target Steel
level 3---Target (detail)
level 4---Obtainable information crack, crevice, structure, molphology
level 5---Technique imaging

Inquiry number

SOL-0000004508

Last modified 2011-07-28 13:23
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