Grain boundary characterization utilizing high-resolution X-ray CT and SEM/EBSP orientation analysis
Body text
High-resolution X-ray computer tomography is a non-destructive inspection to study micro-defects of inside materials three dimensionally. An elemental mass ratio, i.e. concentration is investigated by the use of a linear absorption coefficient value, which is different from elementals in the X-ray CT. Figures show (a) distribution of gallium concentration obtained by X-ray CT and (b) grain orientation mapping investigated by SEM/EBSP analysis in the same region of a sample surface. High concentrations have been observed on grain boundary with a high misorientation angle that is considered having high energy. Dependence of the concentration on grain boundary character is revealed.
Scientific keywords
| A. Sample category | inorganic material |
|---|---|
| B. Sample category (detail) | metal, alloy, solid-state crystal |
| C. Technique | absorption and its secondary process |
| D. Technique (detail) | |
| E. Particular condition | 3D imaging (cf. CT), interface, room temperature, time-resolved (slow) |
| F. Photon energy | X-ray (4-40 keV) |
| G. Target information | local structure, dislocation, strain, structural change, morphology |
Industrial keywords
| level 1---Application area | mechanics, industrial material |
|---|---|
| level 2---Target | Steel |
| level 3---Target (detail) | |
| level 4---Obtainable information | crack, crevice, structure, molphology |
| level 5---Technique | imaging |
Inquiry number
SOL-0000004508
Last modified
2022-05-09 15:51