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The 282nd SPring-8 Seminar

Subject/Contents XTIP – A dedicated beamline for synchrotron X-ray scanning tunneling microscopy
Period from 10:00 to 11:00 Tue., Mar 05 , 2019
Venue Kamitsubo Memorial Hall
Format Lecture

Speaker: Dr. Nozomi Shirato

Language: English

Affiliation: Argonne National Laboratory

Title: XTIP – A dedicated beamline for synchrotron X-ray scanning tunneling microscopy

 Advancements of scanning probe microscopy have been contributing to broaden fundamental understanding of surface physics. By combining high intense X-ray beam as a probe and a functionalized tip as a detector, synchrotron X-ray scanning tunneling microscopy (SX-STM) has been developed at Advanced Photon Source in Argonne National Laboratory. The recent studies demonstrated the technique has capabilities to extract chemical information with sensitivity at the atomic limit [1] and localized magnetic contrast by utilizing polarized beams [2]. At APS, in order to fully exploit potentials of the microscope, a dedicated beamline is under construction and close to see a first light. Equipped with a polarizer and focusing optics, the soft X-ray beamline can produce a photon flux of 1011-1013 photons/sec at 1 keV over the energy range of 500 to 1600 eV. A spherical grating monochromator will deliver a resolving power better than 4000. The capabilities of the beamline will benefit the communities to explore chemical, magnetic and electronic properties of materials at atomic resolution.

[1] N. Shirato et al., Nano Letters 14, 6499 (2014).
[2] A. DiLullo et al., J. Synchrotron Rad. 23, 574 (2016).

Organizer: Nakamura Tetsuya
e-mail: nakaatspring8.or.jp
PHS: 3244

Last modified 2019-02-25 13:16