The 291st SPring-8 Seminar
| Subject/Contents | EIGER2 CdTe DETECTORS: TOOLS FOR HARD X-RAY STUDIES |
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| Period | from 13:30 to 14:30 Tue., Sep 17 , 2019 |
| Venue | Kamitsubo Memorial Hall |
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| Abstract |
Speaker: Mr. Sascha Grimm (Head of Support & Commissioning) Language: English Affiliation: DECTRIS Ltd, Baden-Daettwil, Switzerland Title: EIGER2 CdTe DETECTORS: TOOLS FOR HARD X-RAY STUDIES Abstract: Here, we present results from first experiments and characterization methods. Detector properties like count rate capability, readout, and spatial resolution are demonstrated with dedicated key experiments. With an EIGER2 X 1M CdTe we collected excellent high-pressure data from crystals in a diamond anvil cell. Combined with characterization measurements at beamlines and in the laboratory, these results show how the latest HPC CdTe detectors advance X-ray micro- and nanoanalysis. Organizer: JASRI Diffraction and Scattering Division Imai Yasuhiko |
| Contact Address |
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spring8.or.jp/PHS: 3478