Priority Research Proposals 2005A: Trial Use Proposals
CONTACT: SPring-8 Users Office; sp8jasri@spring8.or.jp
| S/N | Proposal No. | Title of Experiment | Project Leader | Affiliation | Country | BL | Shifts |
| 1 | 2005A0030-NI-np-TU | Characterization of polymide films for LCD by X-ray reflectmetry and small angle scattering | Kimiaki Tsutsui | Nissan Chemical Industries, Ltd. | Japan | BL19B2 | 6 |
| 2 | 2005A0052-NI-np-TU | Analysis of localized crystal structures in thin-film phosphors for inorganic electroluminescent display | Shinji Okamoto | NHK | Japan | BL19B2 | 6 |
| 3 | 2005A0074-NI-np-TU | Evaluation of size distribution and the correlatiion between FePt nano-particles based on the grazing incidence small angle x-ray scattering(GISAXS) | Naoki Awaji | Fujitsu Laboratories, Ltd. | Japan | BL19B2 | 6 |
| 4 | 2005A0075-NI-np-TU | Analysis of Crystal Field near Ce Ion in Green Phosphor CSS and CSO (2) | Motoyuki Shigeiwa | Mistubishi Chemical Group Science and Technology Research Center, Inc. | Japan | BL19B2 | 6 |
| 5 | 2005A0078-NI-np-TU | Structural studies on iodide doped poly(vinyl alcohol) films by extended X-ray adsorption fine structure techniques for the preparation of a high quality polarizer | Akira Shimazu | Nitto Denko Corporation | Japan | BL19B2 | 3 |
| 6 | 2005A0080-NI-np-TU | Non-destructive,high-resolution strain evaluation in strained Si substrates | Atsushi Ogura | Meiji University | Japan | BL13XU | 3 |
| 7 | 2005A0102-NI-np-TU | Radial distribution functions of amorphous Hf02 and hafnium silicate film studied by grazing incidence X-ray scattering | Ichiro Hirosawa | JASRI | Japan | BL46XU | 6 |
| 8 | 2005A0190-NI-np-TU | Analysis for interfacial structure in single-and multilayered polymer films | Sgiheki Nakahara | Mitsui Chemical Analysis & Consulting Service Inc. | Japan | BL13XU | 3 |
| 9 | 2005A0201-NI-np-TU | Structural characterization of high-temperature annealed high-k dielectric films | Hideyuki Yamazaki | Toshiba Corporation | Japan | BL13XU | 3 |
| 10 | 2005A0262-NI-np-TU | Structural analysis of amorphous silicon thin films for solar cell by grazing incidence X-ray scattering | Akihiro Takano | Fuji Electric Advanced Technology Co., Ltd. | Japan | BL46XU | 6 |
| 11 | 2005A0348-NI-np-TU | In situ analysis to select the best polymorph of Prednizolone with synchrotron X-ray powder diffraction method | Shintarou Misaki | Shionogi & Co., Ltd. | Japan | BL19B2 | 3 |
| 12 | 2005A0373-NI-np-TU | Preparative study of in-situ X-ray diffraction measurements of Bi-based superconducting wire during sintering process | Junji Iihara | Sumitomo Electric Industories, Ltd. | Japan | BL19B2 | 6 |
| 13 | 2005A0374-NI-np-TU | Measurement of Size and Shape of Non-metallic Inclusions in High-strength Steels | Yoshikazu Nakai | Kobe University | Japan | BL19B2 | 6 |
| 14 | 2005A0895-RI-np-TU | Chemical state of Ca in calcium silicate complex oxide studied by XAFS | Shinya Matsuno | Asahi Kasei Corporation | Japan | BL19B2 | 6 |
| 15 | 2005A0908-RI-np-TU | Distributed condition analysis of CNT composites | Hirofumi Takase | Takiron Co., Ltd. | Japan | BL19B2 | 3 |
| 16 | 2005A0912-RI-np-TU | Analysis of Crystal Field around Eu and Mn ions in Alkaline-earth Silicate Phosphors for White Light Illumination | Masayoshi Mikami | Mistubishi Chemical Group Science and Technology Research Center, Inc. | Japan | BL19B2 | 6 |
| 17 | 2005A0916-RI-np-TU | Study on Crystalline Structure of Damaged Layer Produced by Gas Cluster Ion Beam Irradiation Using X-ray Diffraction | Tatsumi Hirano | Hitachi, Ltd. | Japan | BL19B2 | 6 |
| 18 | 2005A0918-RI-np-TU | Chemical Characterization of Catalysts in Li-N-H Hydrogen Storage Materials by XAFS Measurement | Takayuki Ichikawa | Hiroshima University | Japan | BL19B2 | 6 |
| 19 | 2005A0894-RI-np-TU | Structural analysis of Ru on supported catalyst and Sb in polymer by XAFS | Kazunari Shiozawa | Mitsui Chemical Analysis & Consulting Service Inc. | Japan | BL19B2 | 6 |
| 20 | 2005A0898-RI-np-TU | Optimization of biological processes for the removal of arsenic from groundwater based on X-ray spectroscopic analyses | Yoko Fujikawa | Kyoto University | Japan | BL19B2 | 6 |
| 21 | 2005A0900-RI-np-TU | Study of luminescent centers in rare-earth activated phosphor thin films by XAFS | Takashi Kunimoto | Tokushima Bunri University | Japan | BL19B2 | 6 |