SPring-8, the large synchrotron radiation facility

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Priority Research Proposals 2005A: Trial Use Proposals

CONTACT: SPring-8 Users Office; sp8jasri@spring8.or.jp

S/N Proposal No. Title of Experiment Project Leader Affiliation Country BL Shifts
1 2005A0030-NI-np-TU Characterization of polymide films for LCD by X-ray reflectmetry and small angle scattering Kimiaki Tsutsui Nissan Chemical Industries, Ltd. Japan BL19B2 6
2 2005A0052-NI-np-TU Analysis of localized crystal structures in thin-film phosphors for inorganic electroluminescent display Shinji Okamoto NHK Japan BL19B2 6
3 2005A0074-NI-np-TU Evaluation of size distribution and the correlatiion between FePt nano-particles based on the grazing incidence small angle x-ray scattering(GISAXS) Naoki Awaji Fujitsu Laboratories, Ltd. Japan BL19B2 6
4 2005A0075-NI-np-TU Analysis of Crystal Field near Ce Ion in Green Phosphor CSS and CSO (2) Motoyuki Shigeiwa Mistubishi Chemical Group Science and Technology Research Center, Inc. Japan BL19B2 6
5 2005A0078-NI-np-TU Structural studies on iodide doped poly(vinyl alcohol) films by extended X-ray adsorption fine structure techniques for the preparation of a high quality polarizer Akira Shimazu Nitto Denko Corporation Japan BL19B2 3
6 2005A0080-NI-np-TU Non-destructive,high-resolution strain evaluation in strained Si substrates Atsushi Ogura Meiji University Japan BL13XU 3
7 2005A0102-NI-np-TU Radial distribution functions of amorphous Hf02 and hafnium silicate film studied by grazing incidence X-ray scattering Ichiro Hirosawa JASRI Japan BL46XU 6
8 2005A0190-NI-np-TU Analysis for interfacial structure in single-and multilayered polymer films Sgiheki Nakahara Mitsui Chemical Analysis & Consulting Service Inc. Japan BL13XU 3
9 2005A0201-NI-np-TU Structural characterization of high-temperature annealed high-k dielectric films Hideyuki Yamazaki Toshiba Corporation Japan BL13XU 3
10 2005A0262-NI-np-TU Structural analysis of amorphous silicon thin films for solar cell by grazing incidence X-ray scattering Akihiro Takano Fuji Electric Advanced Technology Co., Ltd. Japan BL46XU 6
11 2005A0348-NI-np-TU In situ analysis to select the best polymorph of Prednizolone with synchrotron X-ray powder diffraction method Shintarou Misaki Shionogi & Co., Ltd. Japan BL19B2 3
12 2005A0373-NI-np-TU Preparative study of in-situ X-ray diffraction measurements of Bi-based superconducting wire during sintering process Junji Iihara Sumitomo Electric Industories, Ltd. Japan BL19B2 6
13 2005A0374-NI-np-TU Measurement of Size and Shape of Non-metallic Inclusions in High-strength Steels Yoshikazu Nakai Kobe University Japan BL19B2 6
14 2005A0895-RI-np-TU Chemical state of Ca in calcium silicate complex oxide studied by XAFS Shinya Matsuno Asahi Kasei Corporation Japan BL19B2 6
15 2005A0908-RI-np-TU Distributed condition analysis of CNT composites Hirofumi Takase Takiron Co., Ltd. Japan BL19B2 3
16 2005A0912-RI-np-TU Analysis of Crystal Field around Eu and Mn ions in Alkaline-earth Silicate Phosphors for White Light Illumination Masayoshi Mikami Mistubishi Chemical Group Science and Technology Research Center, Inc. Japan BL19B2 6
17 2005A0916-RI-np-TU Study on Crystalline Structure of Damaged Layer Produced by Gas Cluster Ion Beam Irradiation Using X-ray Diffraction Tatsumi Hirano Hitachi, Ltd. Japan BL19B2 6
18 2005A0918-RI-np-TU Chemical Characterization of Catalysts in Li-N-H Hydrogen Storage Materials by XAFS Measurement Takayuki Ichikawa Hiroshima University Japan BL19B2 6
19 2005A0894-RI-np-TU Structural analysis of Ru on supported catalyst and Sb in polymer by XAFS Kazunari Shiozawa Mitsui Chemical Analysis & Consulting Service Inc. Japan BL19B2 6
20 2005A0898-RI-np-TU Optimization of biological processes for the removal of arsenic from groundwater based on X-ray spectroscopic analyses Yoko Fujikawa Kyoto University Japan BL19B2 6
21 2005A0900-RI-np-TU Study of luminescent centers in rare-earth activated phosphor thin films by XAFS Takashi Kunimoto Tokushima Bunri University Japan BL19B2 6