General Proposals 2011A (9/9)
| S/N | #1-50 | #51-100 | #101-150 | #151-200 | #201-250 | #251-300 | #301-350 | #351-400 | #401-415 |
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| S/N | Proposal Number | Proposal Title | Project Leader | Affiliation | Country | Affiliation Category | Research Category | Shift | Beamline | Proprietary(P) /Non-proprietary(Np) |
| 401 | 2011A1811 | Studies of Interface condition and conduction band offset of SiC-MOSFET by Hard X-ray Photoelectron Spectroscopy | Naoko Takahashi | Toyota Central R&D Laboratories, Inc. | Japan | Industry | Industrial Applications | 6 | BL46XU | P |
| 402 | 2011A1813 | Characterization of functional thin films using high-resolution hard X-ray photoelectron spectroscopy | Kenji Nomura | Fujitsu Laboratories, Ltd. | Japan | Industry | Materials Science and Engineering | 2 | BL46XU | P |
| 403 | 2011A1818 | Crystallinity estimation of Organic Thin Films(5） | Hiroto Itoh | Konica Minolta Technology Center, Inc. | Japan | Industry | Industrial Applications | 1 | BL46XU | P |
| 404 | 2011A1820 | HAX-PES measurement of inorganic materials | Yoshiki Shimodaira | Showa Denko K.K. | Japan | Industry | Industrial Applications | 3 | BL46XU | P |
| 405 | 2011A1109 | Structure analysis of high-tensile strength fibers with nano-porous of various biodegradable polyesters by X-ray micro-tomography and micro-beam X-ray diffraction | Tadahisa Iwata | The University of Tokyo | Japan | Educational Organization | Materials Science and Engineering | 9 | BL47XU | Np |
| 406 | 2011A1227 | Characterization of electronic structure at interface of oxide semiconductors using hard x-ray photoelectron spectroscopy | Shizuka Hosoi | Sony Corporation | Japan | Industry | Industrial Applications | 6 | BL47XU | Np |
| 407 | 2011A1322 | Feasibility study of X-ray imaging microscopy using X-ray guide tube as a beam condenser for field illumination | Yoshio Suzuki | Japan Synchrotron Radiation Research Institute | Japan | National and Nonprofit Organization | Life Science | 9 | BL47XU | Np |
| 408 | 2011A1388 | 2nd round preliminary examination of asteroid Itokawa particles in Hayabusa mission: Their three-dimensional structures and its application to downstream destructive analyses in the initial analytical flow | Akira Tsuchiyama | Osaka University | Japan | Educational Organization | Earth and Planetary Science | 15 | BL47XU | Np |
| 409 | 2011A1415 | Development of basic technology for the dark matter search with high resolution nuclear emulsion using X-ray micro-beam/scanning microscope | Yuzuru Tawara | Nagoya University | Japan | Educational Organization | Elementary Particles, Nuclear Science | 15 | BL47XU | Np |
| 410 | 2011A1420 | Depth Analysis using Angle Resolved Wide Acceptance Angle Lens | Eiji Ikenaga | Japan Synchrotron Radiation Research Institute | Japan | National and Nonprofit Organization | Materials Science and Engineering | 12 | BL47XU | Np |
| 411 | 2011A1453 | Development of high-spatial-resolution dark-field imaging using imaging x-ray microscope optics with Kohler-illumination | Akihisa Takeuchi | Japan Synchrotron Radiation Research Institute | Japan | National and Nonprofit Organization | Materials Science and Engineering | 12 | BL47XU | Np |
| 412 | 2011A1464 | Linear Dichroism in Hard X-ray Photoemission from Topological Insulators | Gerhard Fecher | Johannes Gutenberg-University, Mainz | Germany | Foreign | Materials Science and Engineering | 12 | BL47XU | Np |
| 413 | 2011A1537 | 3D XAFS measurements by X-ray laminography method for fuel-cell Pt catalysts | Mizuki Tada | National Institutes of Natural Sciences | Japan | National and Nonprofit Organization | Chemical Science | 9 | BL47XU | Np |
| 414 | 2011A1558 | HX-PES study of semiconductor materials | Nobutaka Satou | Toshiba Nanoanalysis Corporation | Japan | Industry | Industrial Applications | 6 | BL47XU | P |
| 415 | 2011A1569 | Characterization of metal/GeO2 interfacial structure in Ge-MOS by HAXPES | Asami Yasui | Toray Research Center | Japan | Industry | Industrial Applications | 3 | BL47XU | P |