2012A Time-Designated Proposals
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| S/N | Proposal Number | Proposal Title | Project Leader | Affiliation | Country | Affiliation Category | Research Category | Shift | Beamline | Proprietary(P) /Non-proprietary(Np) |
| 1 | 2012A1712 | Evaluation of valence band spectra of transparent amorphous oxide semiconductor, In-Ga-Zn-O, by hard X-ray photoelectron spectroscopy | Satoshi Horiuchi | Foundation for Promotion of Material Science and Technology of Japan | Japan | National and Nonprofit Organization | Materials Science and Engineering | 3 | BL47XU | P |
| 2 | 2012A1797 | X-ray diffraction measurement of semiconductor materials. | Riichiro Takaishi | Toshiba Corporation | Japan | Industry | Industrial Applications | 3 | BL46XU | P |
| 3 | 2012A1819 | Chemical bonding analysis of organic nanomaterials by hard x-ray photoelectron spectroscopy | Yoshio Watanabe | Keio University | Japan | Educational Organization | Materials Science and Engineering | 1 | BL46XU | P |
| 4 | 2012A1820 | Characterization of SiO2/SiC interface by soft x-ray photoelectron spectroscopy | Daisuke Mori | Fuji Electric Co., Ltd. | Japan | Industry | Industrial Applications | 2 | BL25SU | P |