大型放射光施設 SPring-8

日   時 ： 2005年7月25日　10:30-

講演者 ： Dr. Zhonghou Cai
所   属 ： Advanced Photon Source

講演要旨
　　Inhomogeneity in material is a very common aspect associated with natural/non-natural processes of materials synthesis and fabrication. The understanding of its generic nature is underway, which is creating waves of information that will impact our technology. In the world of micro/nanostructures, domains of various physical and chemical entities have been the grand quests for many years and today X-ray micro/nanodiffraction, with its high structural sensitivity, has become one of the practical means to this end. Combining advanced microfocusing capability with the high brilliance of a synchrotron radiation source, X-ray microdiffraction allows spatially resolved studies of crystallographic phases, microstructures, superstructures, and collective electronic phenomena. In this talk I will explore the paths to characterize domains of antiferromagnetism and ferroelectricity, depinning of the charge-density wave pinned to the defects of the underlying lattice, induced strain fields in substrate crystals and thin films by epitaxial microfeatures and dislocation boundaries, and internal structures of individual nanomaterials.