大型放射光施設 SPring-8

Speaker: Dr. J. Murray Gibson

Language: English

Affiliation: College of Science, Northeastern University, Boston, USA

Title: Measurement of Topological Structure in Amorphous Solids using Coherent Diffraction

Glasses and other amorphous solids are widely used for their mechanical, optical and electronic properties, yet the correlation between properties and structure is poorly understood. One missing link is “medium-range-order” (MRO) which often arises from topological atomic structure. While important to properties, MRO has been notoriously hard to study because conventional diffraction gives only short-range order. Using coherent diffraction techniques such as Fluctuation Electron Microscopy (FEM)^[1], this problem can be solved. We describe the techniques and its applications to amorphous semiconductors in detail. The use of transmission electron diffraction and x-ray diffraction is discussed. We also review some other applications, including the promise of FEM's use in studying partially-ordered organic and biological systems.

[1] Gibson, J. M.; Treacy, M. M. J.; Sun, T.; et al., Phys. Rev. Lett. 105, 125504 (2012).

Organizer: 高田昌樹
Mail：takatama@spring8.or.jp
PHS：3485