General Proposals 2010B (10/10)
| S/N | #1-50 | #51-100 | #101-150 | #151-200 | #201-250 | #251-300 | #301-350 | #351-400 | #401-450 | #451-461 |
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"Title for Public Announcement" is shown for proprietary proposal.
| S/N | Proposal Number | Proposal Title | Project Leader | Affiliation | Country | Affiliation Category | Research Category | Shift | Beamline | Proprietary(P) /Non-proprietary(Np) |
| 451 | 2010B1915 | Analysis of band bending for an AlGaN/GaN heterostructure | Naoko Takahashi | Toyota Central R&D Laboratories, Inc. | Japan | Industry | Industrial Applications | 6 | BL46XU | P |
| 452 | 2010B1916 | Surface Structure of Lithium Battery Electrodes：Using in Situ X-ray Diffraction and Epitaxial thin-films | Machiko Abe | Toyota Motor Corporation | Japan | Industry | Materials Science and Engineering | 6 | BL46XU | P |
| 453 | 2010B1917 | Chemical state analysis of Silicon oxide film utilizing soft and hard X-ray photoelectron spectroscopy | Hiroto Itoh | Konica Minolta Technology Center, Inc. | Japan | Industry | Industrial Applications | 1 | BL46XU | P |
| 454 | 2010B1918 | X-ray wide angle scattering of amorphous thin films | Takashi Matsui | Fuji Film Corporation | Japan | Industry | Industrial Applications | 6 | BL46XU | P |
| 455 | 2010B1425 | Depth Analysis using Angle Resolved Wide Acceptance Angle Lens | Eiji Ikenaga | JASRI | Japan | National and Nonprofit Organization | Materials Science and Engineering | 3 | BL47XU | Np |
| 456 | 2010B1431 | In-depth profiling of bi-layer high-k gate stack structures studied by hard x-ray angle-resolved photoemission spectroscopy | Satoshi Toyoda | The University of Tokyo | Japan | Educational Organization | Materials Science and Engineering | 6 | BL47XU | Np |
| 457 | 2010B1531 | Preliminary examination of Hayabusa samples returned from the asteroid Itokawa: Their three-dimensional structures and its application to downstream destructive analyses in the initial analytical flow. | Akira Tsuchiyama | Osaka University | Japan | Educational Organization | Earth and Planetary Science | 15 | BL47XU | Np |
| 458 | 2010B1648 | HX-PES study of semiconductor materials | Nobutaka Satou | Toshiba Nanoanalysis Corporation | Japan | Industry | Industrial Applications | 6 | BL47XU | P |
| 459 | 2010B1649 | Structural analysis of inner and interface of thin films by using a hard-X-ray photoelectron spectroscopy | Masaki Hachiya | Fuji Film Corporation | Japan | Industry | Industrial Applications | 6 | BL47XU | P |
| 460 | 2010B1656 | Hard X-ray photoemission spectroscopy for rare-earth compounds | Hiroyuki Kimoto | Toyota Motor Corporation | Japan | Industry | Materials Science and Engineering | 9 | BL47XU | P |
| 461 | 2010B1659 | HAXPES Study on various Transparent Conductive Oxide | Asami Yasui | Toray Research Center | Japan | Industry | Industrial Applications | 6 | BL47XU | P |