大型放射光施設 SPring-8

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BL01B1 19Ge detector

問い合わせ番号

INS-0000000379

19-element Ge solid-state detector for fluorescence mode XAFS

  The 19-element Ge solid-state detector is used for fluorescence mode XAFS for dilute or thin film samples which require the higher energy resolution to measure the isolated fluorescence signal from target materials.

Detectable size 100 mm2 × 10 mmt × 19 elements
Energy range 3.8 ∼ 113 keV
Sample condition dilute sample concentration > 10 ppm
thin film sample thickness > 0.1 nm

View of glazing-incidence fluorescence XAFS for thin film sample with 19-element SSD.
In K-edge XAFS spectra of 8 wt% In in 3 nm InxGa1-xN film at room temperature [1].
Rh K-edge XAFS spectra of 80 ppm Rh-colloid/EtOH-H2O at room temperature [2].

References

  1. T. Miyajima, Y. Kudo, K.-Y. Liu, T. Uruga, T. Asatsuma, T. Hino and T. Kobayashi, Phys. Stat. Sol. B 228, 45 (2001).
  2. M. Harada and T. Yamamoto, SPring-8 User Experimental Report, 6 1 (2001).
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