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Local structure analysis of metal endohedral fullerenes La2@C80

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Inquiry number

SOL-0000001209

Beamline

BL01B1 (XAFS I)

Scientific keywords

A. Sample category inorganic material
B. Sample category (detail) metal, alloy, amorphous, glass
C. Technique absorption and its secondary process
D. Technique (detail) XAFS, EXAFS, XANES
E. Particular condition polarization (linear), room temperature
F. Photon energy X-ray (> 40 keV)
G. Target information chemical state, chemical bonding, molecular structure, local structure

Industrial keywords

level 1---Application area display, cell (battery), Chemical product, industrial material
level 2---Target catalysis
level 3---Target (detail) TFT
level 4---Obtainable information local structure, electronic state, chemical state
level 5---Technique XAFS, NEXAFS

Classification

A80.30 inorganic material, M40.10 XAFS

Body text

In this solution, La K-edge XAFS method was applied to study local structure of metal endohedral fullerene, La2@C80. EXAFS and XANES method provide local structure information (distance, coordination number, species of neighbor atoms) and local electronic structure information (valence, species of neighbor atoms) of selected elements, respectively. XAFS analysis of La2@C80 revealed that La(III) dimmer exists in C80 cage as shown in the figure.

Fig. Model structure of La2@C80

[ Y. Kubozono, Y. Takabayashi, S. Kashino, M. Kondo, T. Wakahara, T. Akasaka, K. Kobayashi, S. Nagase, S. Emura and K. Yamamoto, Chemical Physics Letters 335, 163-169 (2001), Fig. 3,
©2001 Elsevier B. V. ]

 

Source of the figure

Original paper/Journal article

Journal title

Y. Kubozono et al., Chem. Phys. Let, 335, (2001) 163

Figure No.

3

Technique

XAFS spectra of dense samples are taken in a transmission mode. This method is performed by measuring x-ray absorption as a function of x-ray energy around an absorption edge of a selected element. For elements from Sn to Eu in the periodic table, K-edge XAFS has advantages, such as high-spatial resolution and small contribution of multi-electron excitations, compared with L3-edge XAFS. Acquisition time per XAFS spectrum using QXAFS mode is 15-30 min in this solution.

Source of the figure

Private communication/others

Description

講習会プレゼン資料

Required time for experimental setup

2 hour(s)

Instruments

Instrument Purpose Performance
XAFS Measurement System Measurement of XAFS spectra 3.8-113 keV
Ionization Chamber Measurement of transmission mode XAFS concentration > 1000 ppm

References

Document name
Y. Kubozono et al., Chem. Phys. Let, 335, (2001) 163.

Related experimental techniques

Questionnaire

The measurement was possible only in SPring-8. Impossible or very difficult in other facilities.
This solution is an application of a main instrument of the beamline.

Ease of measurement

Easy

Ease of analysis

Middle

How many shifts were needed for taking whole data in the figure?

Less than one shift

Last modified 2022-05-06 15:21