Local structure analysis of metal endohedral fullerenes La2@C80
Inquiry number
SOL-0000001209
Beamline
BL01B1 (XAFS I)
Scientific keywords
A. Sample category | inorganic material |
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B. Sample category (detail) | metal, alloy, amorphous, glass |
C. Technique | absorption and its secondary process |
D. Technique (detail) | XAFS, EXAFS, XANES |
E. Particular condition | polarization (linear), room temperature |
F. Photon energy | X-ray (> 40 keV) |
G. Target information | chemical state, chemical bonding, molecular structure, local structure |
Industrial keywords
level 1---Application area | display, cell (battery), Chemical product, industrial material |
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level 2---Target | catalysis |
level 3---Target (detail) | TFT |
level 4---Obtainable information | local structure, electronic state, chemical state |
level 5---Technique | XAFS, NEXAFS |
Classification
A80.30 inorganic material, M40.10 XAFS
Body text
In this solution, La K-edge XAFS method was applied to study local structure of metal endohedral fullerene, La2@C80. EXAFS and XANES method provide local structure information (distance, coordination number, species of neighbor atoms) and local electronic structure information (valence, species of neighbor atoms) of selected elements, respectively. XAFS analysis of La2@C80 revealed that La(III) dimmer exists in C80 cage as shown in the figure.
Fig. Model structure of La2@C80
[ Y. Kubozono, Y. Takabayashi, S. Kashino, M. Kondo, T. Wakahara, T. Akasaka, K. Kobayashi, S. Nagase, S. Emura and K. Yamamoto, Chemical Physics Letters 335, 163-169 (2001), Fig. 3,
©2001 Elsevier B. V. ]
Source of the figure
Original paper/Journal article
Journal title
Y. Kubozono et al., Chem. Phys. Let, 335, (2001) 163
Figure No.
3
Technique
XAFS spectra of dense samples are taken in a transmission mode. This method is performed by measuring x-ray absorption as a function of x-ray energy around an absorption edge of a selected element. For elements from Sn to Eu in the periodic table, K-edge XAFS has advantages, such as high-spatial resolution and small contribution of multi-electron excitations, compared with L3-edge XAFS. Acquisition time per XAFS spectrum using QXAFS mode is 15-30 min in this solution.
Source of the figure
Private communication/others
Description
講習会プレゼン資料
Required time for experimental setup
2 hour(s)
Instruments
Instrument | Purpose | Performance |
---|---|---|
XAFS Measurement System | Measurement of XAFS spectra | 3.8-113 keV |
Ionization Chamber | Measurement of transmission mode XAFS | concentration > 1000 ppm |
References
Document name |
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Y. Kubozono et al., Chem. Phys. Let, 335, (2001) 163. |
Related experimental techniques
Questionnaire
The measurement was possible only in SPring-8. Impossible or very difficult in other facilities.
This solution is an application of a main instrument of the beamline.
Ease of measurement
Easy
Ease of analysis
Middle
How many shifts were needed for taking whole data in the figure?
Less than one shift