散漫散乱:原子配列の乱れを観測する
Inquiry number
SOL-0000001260
Beamline
BL02B1 (Single Crystal Structure Analysis)
Scientific keywords
| A. Sample category | inorganic material |
|---|---|
| B. Sample category (detail) | magnetic material, insulator, ceramics, solid-state crystal, crystal |
| C. Technique | X-ray diffraction, X-ray elastic scattering |
| D. Technique (detail) | single crystal, diffuse scattering, wide angle scattering |
| E. Particular condition | polarization (linear), room temperature |
| F. Photon energy | X-ray (4-40 keV) |
| G. Target information | dislocation, strain, structural change, phase transition |
Industrial keywords
| level 1---Application area | electric component, storage device, cell (battery), Chemical product, industrial material |
|---|---|
| level 2---Target | condenser, HD,MO, rechargeable battery, and solar cell |
| level 3---Target (detail) | capacitance insulator, magnetic layer, magnetic head |
| level 4---Obtainable information | crystal structure, valence |
| level 5---Technique | diffraction, X-ray diffraction |
Classification
A80.14 magnetic materials, A80.30 inorganic material, M10.10 single crystal diffraction
Body text
Ｘ線散漫散乱は、電荷分布の乱れを調べることのできる有効な手法です。この手法を用いることで、 結晶中の原子位置の乱雑さを測定することができます。この手法は、様々な温度・圧力・外場などの試料環境下において非破壊で実施することが可能です。図に示すのは、 Pr0.6Ca0.4MnO3について測定した(10,4,0)基本反射まわりの散漫散乱強度です。この結果から、始めにMnイオン価数の不均化が起こり次いでMnイオン間の相関が発達するというMnイオンの電荷・軌道秩序発生の前駆現象の詳細がわかりました。
[ S. Shimomura, T. Tonegawa, K. Tajima, N. Wakabayashi, N. Ikeda, T. Shobu, Y. Noda, Y. Tomioka and Y. Tokura, Physical Review B 62, 3875-3878 (2000), Fig. 5,
©2000 American Physical Society ]
Source of the figure
Original paper/Journal article
Journal title
Phys. Rev. B 62, 3875 (2000)
Figure No.
5
Technique
単結晶回折実験は、物質の構造を原子的尺度で調べられる強力な測定方法です。この方法は、結晶であればどんな物質にも適用でき、原子レベルの構造を解明することができます。
Source of the figure
No figure
Required time for experimental setup
4 hour(s)
Instruments
| Instrument | Purpose | Performance |
|---|---|---|
| ４軸回折計 | 回折強度測定 |
References
| Document name |
|---|
| S. Shimomura et. al., Phys. Rev. B 62, 3875 (2000). |
Related experimental techniques
中性子線回折、電子線回折
Questionnaire
This solution is an application of a main instrument of the beamline.
Ease of measurement
Middle
Ease of analysis
With a great skill
How many shifts were needed for taking whole data in the figure?
Less than one shift