問い合わせ番号

INS-0000000304

ABSTRACT

  BL04B2 was designed for diffraction and scattering experiments at high energy more than 37 keV. 
Three kinds of experimental stations are equipped in tandem: Two-axis diffractometer and area flat panel detector for disordered materials, and Imaging Plate system for the X-ray diffraction study under high pressure conditions and small-angle X-ray scattering of supercritical fluids.

AREA OF RESEARCH

• Structural analysis of glass, liquid, and amorphous materials
• High energy X-ray diffraction measurements (61, 113 keV)

KEYWORDS

• Scientific field
  High-energy X-ray diffraction, Disordered materials, High pressure
• Equipment
  Two-axis diffractometer, FPD (area flat panel detector), cryostat (20K~RT), high-temperature furnace (~1,300 K), conical nozzle levitation furnace with a 100W CO2 laser (1,200~3,200 K)

SOURCE AND OPTICS

  Light source is a bending magnet and horizontal divergence of the beam is limited to 0.73 mrad by a fixed mask. To carry out the experiments with high-energy, modest-resolution, and focused X-rays, we adopt a single-bounce, bent-crystal monochromator which deflects the beam horizontally. Since the available Bragg angle is fixed to 3 deg,  we can change energy discretely by selecting reflection net-planes. The Si 111 (37.8, 113.4 keV) and Si 220 (61.4 keV) crystals are available. The adjustable bending radius (320 m to 430 m) of Si crystals installed at 46 m from the light source, enables us to accord the focus position at 10 m to 15 m in the experimental hutch from the monochromator.

Schematic View of Beamline

• X-rays at Sample

  Energy	Si (111) : 37.8, 113.4 keV Si (220) : 61.4 keV
  Energy resolution	Δ E/E = 10-3 @15 m from the monochromator (at the incident beam size : 0.2 (H) × 4 (W) mm2)
  Photon flux	37.8 keV Flat : 2.2 × 1010 (photons/sec/1 × 1 mm2 @100 mA) , Bent (at focus point) : 7.1 ×1011 61.7 keV Flat : 3.4 × 109 , Bent (at focus point) : 9.2 × 1010
  Beam size at focus position	37.8 keV : 0.220 mm 61.7 keV: 0.375 mm (at the incident beam size : 0.2 (H) × 4 (W) mm2)

• Reference
  M. Isshiki, Y. Ohishi, S. Goto, K. Takeshita and T. Ishikawa Nuclear Inst. and Methods in Physics Research, A:(2001) 467-8, 663-666

EXPERIMENTAL STATIONS

• Two-axis diffrractometer for high-energy X-ray diffraction of disordered materials

PUBLICATION SEARCH

* Sorry, Some parts of results are displayed using Japanese characters.

BL04B2 PUBLICATION SEARCH

CONTACT INFORMATION

Please note that each e-mail address is followed by "@spring8.or.jp."

Hiroki YAMADA
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-2750
Fax : +81-(0)791-58-0830
e-mail : h_yamada

Seiya SHIMONO
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-2750
Fax : +81-(0)791-58-0830
e-mail : s_shimono

Jo-chi Tseng
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-2750
Fax : +81-(0)791-58-0830
e-mail : jochi.tseng