BL04B2 OUTLINE
Inquiry number
INS-0000000304
ABSTRACT
BL04B2 was designed for diffraction and scattering experiments at high energy more than 37 keV. Three kinds of experimental stations are equipped in tandem: Two-axis diffractometer for disordered materials, and Imaging Plate system for the X-ray diffraction study under high-pressure conditions and small-angle X-ray scattering of supercritical fluids.
AREA OF RESEARCH
- Structural analysis of glass, liquid, and amorphous materials
- X-ray diffraction under ultra high-pressure
- Small angle scattering of supercritical fluid
KEYWORDS
- Scientific field
High-energy X-ray diffraction, Disordered materials, High pressure, Supercritical fluids, Small-angle scattering - Equipment
Two-axis diffractometer, high-temperature furnace (~1000°C), conical nozzle levitation furnace with a 100W CO2 laser (1,000-3,000°C), DAC (diamond anvil cell), IP (image plate)
SOURCE AND OPTICS
Light source is a bending magnet and horizontal divergence of the beam is limited to 0.73 mrad by a fixed mask. To carry out the experiments with high-energy, modest-resolution, and focused X-rays, we adopt a single-bounce, bent-crystal monochromator which deflects the beam horizontally. Since the available Bragg angle is fixed to 3 deg, we can change energy discretely by selecting reflection net-planes. The Si 111 (37.8, 113.3 keV) and Si 220 (61.7 keV) crystals are available. The adjustable bending radius (320 m to 430 m) of Si crystals installed at 46 m from the light source, enables us to accord the focus position at 10 m to 15 m in the experimental hutch from the monochromator.
Schematic View of Beamline
- X-rays at Sample
Energy Si (111) : 37.8, 113.3 keV
Si (220) : 61.7 keVEnergy resolution Δ E/E = 10-3 @15 m from the monochromator (at the incident beam size : 0.2 (H) × 4 (W) mm2) Photon flux 37.8 keV Flat : 2.2 × 1010 (photons/sec/1 × 1 mm2 @100 mA) , Bent (at focus point) : 7.1 ×1011
61.7 keV Flat : 3.4 × 109 , Bent (at focus point) : 9.2 × 1010Beam size at focus position 37.8 keV : 0.220 mm
61.7 keV: 0.375 mm (at the incident beam size : 0.2 (H) × 4 (W) mm2)
- Reference
M. Isshiki, Y. Ohishi, S. Goto, K. Takeshita and T. Ishikawa Nuclear Inst. and Methods in Physics Research, A:(2001) 467-8, 663-666
EXPERIMENTAL STATIONS
- Two-axis diffrractometer for high-energy X-ray diffraction of disordered materials
- Small angle X-ray scattering for supercritical fluids
- Imaging Plate system for the X-ray diffraction study under high pressure conditions
PUBLICATION SEARCH
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BL04B2 PUBLICATION SEARCH
CONTACT INFORMATION
Please note that each e-mail address is followed by "@spring8.or.jp."
Shinji KOHARA
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-0832
Fax : +81-(0)791-58-0830
e-mail : kohara
Yasuo OHISHI
SPring-8 / JASRI
1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198
Phone : +81-(0)791-58-0832
Fax : +81-(0)791-58-0830
e-mail : ohishi

