BL08W High resolution compton scattering spectrometer
問い合わせ番号
INS-0000000359
Station-B : High resolution Compton scattering spectrometer
A Couchois-type X-ray spectrometer has been constructed for high-resolution Compton scattering experiments with an incident X-rays energy of 115 keV. The spectrometer consists of a bent-crystal analyzer and a position sensitive detector. As a position sensitive detector, an X-ray Image Intensifire (X-II) camera or 128-strip Ge-SSD can be used. It covers the focal positions corresponding to the X-ray energies from 70 keV to 90 keV with 80eV energy resolution for the incident X-ray energy of 115 keV and the scattering angle of 165 degrees. It corresponds electrom momentums from -10 atomic unit to 10 atomic unit with 0.14 atomic unit resolution. The use of such high energy X-rays enables us to measure the Compton profiles of heavy element materials with good statistical accuracy.
- 7-T Superconducting magnet
- 10-K Refrigerator for sample (10 K ~ 300 K)
- X-II camera
- 128-strip Ge-SSD
High resolution spectrometer