X-ray fluorescence analysis of trace rare-earth and heavy elements
Inquiry number
SOL-0000001199
Beamline
BL08W (High Energy Inelastic Scattering)
Scientific keywords
| A. Sample category | inorganic material, organic material |
|---|---|
| B. Sample category (detail) | environmental material |
| C. Technique | fluorescent X-rays |
| D. Technique (detail) | trace-element |
| E. Particular condition | room temperature |
| F. Photon energy | X-ray (> 40 keV) |
| G. Target information | trace element |
Industrial keywords
| level 1---Application area | environment |
|---|---|
| level 2---Target | Environmental material |
| level 3---Target (detail) | ash |
| level 4---Obtainable information | element distribution |
| level 5---Technique |
Classification
A60.20 environment, A80.30 inorganic material, A80.32 organic material, A80.40 environmental materials
Body text
X-ray fluorescence (XRF) analyses with 116 keV X-rays as an excitation source is suitable for nondestructive multielemental analyses of heavy elements such as rare-earth elements. It also should be useful for geological, geochemical and archaeological samples as well as industrial materials.
The figure shows the XRF spectrum of geological sample (JG-1, granite rock standard reference sample excited by 116 keV X-rays and a measurement time of 500 sec. The use of high-energy X-rays makes it possible to obtain energy spectra consisting of well separated fluorescence lines from rare-earth elements.
[ I. Nakai, Y. Terada, M. Itou and Y. Sakurai, Journal of Synchrotron Radiation 8, 1078-1081 (2001), Fig. 2,
©2001 International Union of Crystallography ]
Source of the figure
Original paper/Journal article
Journal title
Journal of Synchrotron Radiation, 8 (2001) 1078-1081
Figure No.
2
Technique
The high-energy X-rays emitted from the wiggler and monochromatized by Si400 bent monochromator is injected to the sample. The fluorescence X-rays are detected by a Ge solid state detector.
Source of the figure
No figure
Required time for experimental setup
4 hour(s)
Instruments
| Instrument | Purpose | Performance |
|---|---|---|
| High energy X-ray fluorescent spectrometer | XRF measurement |
References
| Document name |
|---|
| I. Nakai, et. al. , Journal of Synchrotron Radiation, 8 (2001) 1078-1081 |
Related experimental techniques
Questionnaire
With user's own instruments.
Ease of measurement
Easy
Ease of analysis
Easy
How many shifts were needed for taking whole data in the figure?
Less than one shift